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The Review of Scientific Instruments|April 3, 2016
Active cancellation of residual amplitude modulation in a frequency-modulation based Fabry-Perot interferometerYinan Yu, Yicheng Wang, Jon R Pratt
The Review of Scientific Instruments|July 2, 2009
Accurate noncontact calibration of colloidal probe sensitivities in atomic force microscopyKoo-Hyun Chung, Gordon A Shaw, Jon R Pratt
Langmuir : the ACS Journal of Surfaces and Colloids|October 16, 2009
Lateral force calibration: accurate procedures for colloidal probe friction measurements in atomic force microscopyKoo-Hyun Chung, Jon R Pratt, Mark G Reitsma
Journal of Research of the National Institute of Standards and Technology|March 19, 2016
Atomic Force Microscope Cantilever Flexural Stiffness Calibration: Toward a Standard Traceable MethodRichard S Gates, Mark G Reitsma, John A Kramar, et al.
The Review of Scientific Instruments|December 3, 2008
SI traceable calibration of an instrumented indentation sensor spring constant using electrostatic forceKoo-Hyun Chung, Stefan Scholz, Gordon A Shaw, et al.
CIRP Annals ... Manufacturing Technology|June 18, 2021
Contributions of precision engineering to the revision of the SIHarald Bosse, Horst Kunzmann, Jon R Pratt, et al.
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