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Joseph R Michael

Showing results (1-10 of 14) with videos related to

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 7, 2011
Focused ion beam induced microstructural alterations: texture development, grain growth, and intermetallic formationJoseph R Michael
Scanning|June 16, 2011
High resolution at low beam energy in the SEM: resolution measurement of a monochromated SEMJoseph R Michael
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 27, 2012
Application of electron backscatter diffraction for crystallographic characterization of tin whiskersJoseph R Michael, Bonnie B McKenzie, Donald F Susan
Ultramicroscopy|December 14, 2007
Multivariate statistical approach to electron backscattered diffractionLuke N Brewer, Paul G Kotula, Joseph R Michael
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 8, 2007
Tomographic Spectral Imaging with Multivariate Statistical Analysis: Comprehensive 3D MicroanalysisPaul G Kotula, Michael R Keenan, Joseph R Michael
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 25, 2003
Automated analysis of SEM X-ray spectral images: a powerful new microanalysis toolPaul G Kotula, Michael R Keenan, Joseph R Michael
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|June 26, 2020
Comparison of Orientation Mapping in SEM and TEMJoshua D Sugar, Joseph T McKeown, Dhego Banga, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 29, 2021
Mechanism of FIB-Induced Phase Transformation in Austenitic SteelJoseph R Michael, Lucille A Giannuzzi, M Grace Burke, et al.
Forensic Science International|June 24, 2008
Forensic analysis of bioagents by X-ray and TOF-SIMS hyperspectral imagingLuke N Brewer, James A Ohlhausen, Paul G Kotula, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 16, 2021
Identification of Star Defects in Gallium Nitride with HREBSD and ECCITimothy J Ruggles, Julia I Deitz, Andrew A Allerman, et al.
Pageof 2

Showing results (1-10 of 14) with videos related to

Sort By:
Pageof 2
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 7, 2011
Focused ion beam induced microstructural alterations: texture development, grain growth, and intermetallic formationJoseph R Michael
Scanning|June 16, 2011
High resolution at low beam energy in the SEM: resolution measurement of a monochromated SEMJoseph R Michael
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 27, 2012
Application of electron backscatter diffraction for crystallographic characterization of tin whiskersJoseph R Michael, Bonnie B McKenzie, Donald F Susan
Ultramicroscopy|December 14, 2007
Multivariate statistical approach to electron backscattered diffractionLuke N Brewer, Paul G Kotula, Joseph R Michael
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 8, 2007
Tomographic Spectral Imaging with Multivariate Statistical Analysis: Comprehensive 3D MicroanalysisPaul G Kotula, Michael R Keenan, Joseph R Michael
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 25, 2003
Automated analysis of SEM X-ray spectral images: a powerful new microanalysis toolPaul G Kotula, Michael R Keenan, Joseph R Michael
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|June 26, 2020
Comparison of Orientation Mapping in SEM and TEMJoshua D Sugar, Joseph T McKeown, Dhego Banga, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 29, 2021
Mechanism of FIB-Induced Phase Transformation in Austenitic SteelJoseph R Michael, Lucille A Giannuzzi, M Grace Burke, et al.
Forensic Science International|June 24, 2008
Forensic analysis of bioagents by X-ray and TOF-SIMS hyperspectral imagingLuke N Brewer, James A Ohlhausen, Paul G Kotula, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 16, 2021
Identification of Star Defects in Gallium Nitride with HREBSD and ECCITimothy J Ruggles, Julia I Deitz, Andrew A Allerman, et al.
Pageof 2