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Joshua A Taillon

Showing results (1-10 of 8) with videos related to

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 9, 2020
Compressive Sensing Reconstruction for EDS AnalysisJoshua A Taillon
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 9, 2020
An Open Evaluation of Hyperspectral Unmixing Strategies for EDS AnalysisJoshua A Taillon
Micron (Oxford, England : 1993)|January 23, 2025
ETSpy: A HyperSpy extension package for electron tomography data processing and reconstructionAndrew A Herzing, Joshua A Taillon
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 10, 2017
Teaching an Old Material New Tricks: Easy and Inexpensive Focused Ion Beam (FIB) Sample Protection Using Conductive PolymersJoshua A Taillon, Valery Ray, Lourdes G Salamanca-Riba
Studies in Conservation = Etudes De Conservation|February 28, 2020
Characterization of Zinc Carboxylates in an Oil Paint Test PanelChristine Romano, Thomas Lam, G Asher Newsome, et al.
Ultramicroscopy|August 26, 2017
Improving microstructural quantification in FIB/SEM nanotomographyJoshua A Taillon, Christopher Pellegrinelli, Yi-Lin Huang, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 9, 2020
Harvesting Microscopy Experimental Context with a Configurable Laboratory Information Management SystemJoshua A Taillon, Rachel F Devers, Raymond L Plante, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 28, 2021
NexusLIMS: A Laboratory Information Management System for Shared-Use Electron Microscopy FacilitiesJoshua A Taillon, Thomas F Bina, Raymond L Plante, et al.
Pageof 1

Showing results (1-10 of 8) with videos related to

Sort By:
Pageof 1
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 9, 2020
Compressive Sensing Reconstruction for EDS AnalysisJoshua A Taillon
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 9, 2020
An Open Evaluation of Hyperspectral Unmixing Strategies for EDS AnalysisJoshua A Taillon
Micron (Oxford, England : 1993)|January 23, 2025
ETSpy: A HyperSpy extension package for electron tomography data processing and reconstructionAndrew A Herzing, Joshua A Taillon
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 10, 2017
Teaching an Old Material New Tricks: Easy and Inexpensive Focused Ion Beam (FIB) Sample Protection Using Conductive PolymersJoshua A Taillon, Valery Ray, Lourdes G Salamanca-Riba
Studies in Conservation = Etudes De Conservation|February 28, 2020
Characterization of Zinc Carboxylates in an Oil Paint Test PanelChristine Romano, Thomas Lam, G Asher Newsome, et al.
Ultramicroscopy|August 26, 2017
Improving microstructural quantification in FIB/SEM nanotomographyJoshua A Taillon, Christopher Pellegrinelli, Yi-Lin Huang, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 9, 2020
Harvesting Microscopy Experimental Context with a Configurable Laboratory Information Management SystemJoshua A Taillon, Rachel F Devers, Raymond L Plante, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 28, 2021
NexusLIMS: A Laboratory Information Management System for Shared-Use Electron Microscopy FacilitiesJoshua A Taillon, Thomas F Bina, Raymond L Plante, et al.
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