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Jun Yamasaki

Showing results (1-10 of 39) with videos related to

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Microscopy (Oxford, England)|October 26, 2020
Wave field reconstruction and phase imaging by electron diffractive imagingJun Yamasaki
Microscopy (Oxford, England)|November 1, 2014
Nonlinear intensity attenuation with increasing thickness and quantitative TEM tomography of micron-sized materialsJun Yamasaki
Microscopy (Oxford, England)|August 29, 2024
Precise measurement of spatial coherence and axial brightness based on the Wigner function reconstruction in transmission electron microscopes with field emission guns and a thermionic emission gunShuhei Hatanaka, Jun Yamasaki
Micron (Oxford, England : 1993)|November 22, 2023
Sample thickness affects contrast and measured shape in TEM images and in electron tomogramsMisa Hayashida, Jun Yamasaki, Marek Malac
Journal of Electron Microscopy|February 16, 2011
Estimation of wave fields of incident beams in a transmission electron microscope by using a small selected-area apertureShigeyuki Morishita, Jun Yamasaki, Nobuo Tanaka
Journal of Electron Microscopy|June 8, 2004
Direct observation of a stacking fault in Si(1 - x)Ge(x) semiconductors by spherical aberration-corrected TEM and conventional ADF-STEMJun Yamasaki, Tomoyuki Kawai, Nobuo Tanaka
Microscopy (Oxford, England)|November 16, 2017
Precise method for measuring spatial coherence in TEM beams using Airy diffraction patternsJun Yamasaki, Yuki Shimaoka, Hirokazu Sasaki
Micron (Oxford, England : 1993)|September 30, 2022
Origin of spurious intensity in vacuum near sample edge in bright field TEM imagesMisa Hayashida, Marek Malac, Jun Yamasaki
Ultramicroscopy|April 3, 2013
Measurement of spatial coherence of electron beams by using a small selected-area apertureShigeyuki Morishita, Jun Yamasaki, Nobuo Tanaka
Journal of Electron Microscopy|August 27, 2005
A simple method for minimizing non-linear image contrast in spherical aberration-corrected HRTEMJun Yamasaki, Tomoyuki Kawai, Nobuo Tanaka
Pageof 4

Showing results (1-10 of 39) with videos related to

Sort By:
Pageof 4
Microscopy (Oxford, England)|October 26, 2020
Wave field reconstruction and phase imaging by electron diffractive imagingJun Yamasaki
Microscopy (Oxford, England)|November 1, 2014
Nonlinear intensity attenuation with increasing thickness and quantitative TEM tomography of micron-sized materialsJun Yamasaki
Microscopy (Oxford, England)|August 29, 2024
Precise measurement of spatial coherence and axial brightness based on the Wigner function reconstruction in transmission electron microscopes with field emission guns and a thermionic emission gunShuhei Hatanaka, Jun Yamasaki
Micron (Oxford, England : 1993)|November 22, 2023
Sample thickness affects contrast and measured shape in TEM images and in electron tomogramsMisa Hayashida, Jun Yamasaki, Marek Malac
Journal of Electron Microscopy|February 16, 2011
Estimation of wave fields of incident beams in a transmission electron microscope by using a small selected-area apertureShigeyuki Morishita, Jun Yamasaki, Nobuo Tanaka
Journal of Electron Microscopy|June 8, 2004
Direct observation of a stacking fault in Si(1 - x)Ge(x) semiconductors by spherical aberration-corrected TEM and conventional ADF-STEMJun Yamasaki, Tomoyuki Kawai, Nobuo Tanaka
Microscopy (Oxford, England)|November 16, 2017
Precise method for measuring spatial coherence in TEM beams using Airy diffraction patternsJun Yamasaki, Yuki Shimaoka, Hirokazu Sasaki
Micron (Oxford, England : 1993)|September 30, 2022
Origin of spurious intensity in vacuum near sample edge in bright field TEM imagesMisa Hayashida, Marek Malac, Jun Yamasaki
Ultramicroscopy|April 3, 2013
Measurement of spatial coherence of electron beams by using a small selected-area apertureShigeyuki Morishita, Jun Yamasaki, Nobuo Tanaka
Journal of Electron Microscopy|August 27, 2005
A simple method for minimizing non-linear image contrast in spherical aberration-corrected HRTEMJun Yamasaki, Tomoyuki Kawai, Nobuo Tanaka
Pageof 4