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The Review of Scientific Instruments|April 1, 2019
A high speed X-Y nanopositioner with integrated optical motion sensingPriyanka Gupta, P Piyush, R Sriramshankar, et al.The Review of Scientific Instruments|March 5, 2008
Two-axis probing system for atomic force microscopyG R Jayanth, Sissy M Jhiang, Chia-Hsiang MenqThe Review of Scientific Instruments|November 5, 2013
A two-axis in-plane motion measurement system based on optical beam deflectionR Sriramshankar, R Sri Muthu Mrinalini, G R JayanthThe Review of Scientific Instruments|October 3, 2015
Note: A resonating reflector-based optical system for motion measurement in micro-cantilever arraysP Sathishkumar, P Punyabrahma, R Sri Muthu Mrinalini, et al.The Review of Scientific Instruments|December 3, 2013
Note: Design and development of an integrated three-dimensional scanner for atomic force microscopyT Rashmi, G Dharsana, R Sriramshankar, et al.Pageof 2