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Applied Optics|August 19, 2016
Canceling the momentum in a phase-shifting algorithm to eliminate spatially uniform errorsKenichi Hibino, Yangjin KimOptics Express|May 3, 2018
Interferometric profile measurement of optical-thickness by wavelength tuning with suppression of spatially uniform errorYangjin Kim, Kenichi Hibino, Mamoru MitsuishiApplied Optics|February 3, 2016
Compensation for correlated error in multilayer interferometerYangjin Kim, Kenichi Hibino, Naohiko Sugita, et al.Optics Express|December 25, 2015
Simultaneous measurement of surface shape and optical thickness using wavelength tuning and a polynomial window functionYangjin Kim, Kenichi Hibino, Naohiko Sugita, et al.Optics Express|September 15, 2015
Measurement of optical thickness variation of BK7 plate by wavelength tuning interferometryYangjin Kim, Kenichi Hibino, Naohiko Sugita, et al.Optics Express|August 5, 2014
Design of phase shifting algorithms: fringe contrast maximumYangjin Kim, Kenichi Hibino, Naohiko Sugita, et al.Applied Optics|August 19, 2016
Interferometric measurement of surface shape by wavelength tuning suppressing random intensity errorYangjin Kim, Kenichi Hibino, Naohiko Sugita, et al.Optics Express|April 4, 2015
Absolute optical thickness measurement of transparent plate using excess fraction method and wavelength-tuning Fizeau interferometerYangjin Kim, Kenichi Hibino, Naohiko Sugita, et al.Applied Optics|September 15, 2015
Surface measurement of indium tin oxide thin film by wavelength-tuning Fizeau interferometryYangjin Kim, Kenichi Hibino, Naohiko Sugita, et al.Optics Express|October 17, 2014
Multiple-surface interferometry of highly reflective wafer by wavelength tuningYangjin Kim, Kenichi Hibino, Ryohei Hanayama, et al.Pageof 7