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Knut Müller

Showing results (11-20 of 73) with videos related to

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Physical Review Letters|September 13, 2014
Conventional transmission electron microscopy imaging beyond the diffraction and information limitsAndreas Rosenauer, Florian F Krause, Knut Müller, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 3, 2012
Strain measurement in semiconductor heterostructures by scanning transmission electron microscopyKnut Müller, Andreas Rosenauer, Marco Schowalter, et al.
Ultramicroscopy|July 15, 2023
Quantitative electric field mapping between electrically biased needles by scanning transmission electron microscopy and electron holographyJean Felix Dushimineza, Janghyun Jo, Rafal E Dunin-Borkowski, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 24, 2025
Towards a Protein-Size Dependent Resolution Limit due to Dynamical Scattering in Cryo-transmission Electron MicroscopyMax Leo Leidl, Sebastian Sturm, Aikaterina Filopoulou, et al.
Ultramicroscopy|May 14, 2013
Measurement of indium concentration profiles and segregation efficiencies from high-angle annular dark field-scanning transmission electron microscopy imagesThorsten Mehrtens, Knut Müller, Marco Schowalter, et al.
Ultramicroscopy|July 5, 2013
Comparison of intensity and absolute contrast of simulated and experimental high-resolution transmission electron microscopy images for different multislice simulation methodsFlorian F Krause, Knut Müller, Dennis Zillmann, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 25, 2023
Systematic Errors of Electric Field Measurements in Ferroelectrics by Unit Cell Averaged Momentum Transfers in STEMAchim Strauch, Benjamin März, Thibaud Denneulin, et al.
Ultramicroscopy|April 2, 2013
Quantitative chemical evaluation of dilute GaNAs using ADF STEM: avoiding surface strain induced artifactsTim Grieb, Knut Müller, Rafael Fritz, et al.
Ultramicroscopy|December 19, 2020
Accurate measurement of strain at interfaces in 4D-STEM: A comparison of various methodsChristoph Mahr, Knut Müller-Caspary, Tim Grieb, et al.
Ultramicroscopy|December 22, 2015
Effects of instrument imperfections on quantitative scanning transmission electron microscopyFlorian F Krause, Marco Schowalter, Tim Grieb, et al.
Pageof 8

Showing results (11-20 of 73) with videos related to

Sort By:
Pageof 8
Physical Review Letters|September 13, 2014
Conventional transmission electron microscopy imaging beyond the diffraction and information limitsAndreas Rosenauer, Florian F Krause, Knut Müller, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 3, 2012
Strain measurement in semiconductor heterostructures by scanning transmission electron microscopyKnut Müller, Andreas Rosenauer, Marco Schowalter, et al.
Ultramicroscopy|July 15, 2023
Quantitative electric field mapping between electrically biased needles by scanning transmission electron microscopy and electron holographyJean Felix Dushimineza, Janghyun Jo, Rafal E Dunin-Borkowski, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 24, 2025
Towards a Protein-Size Dependent Resolution Limit due to Dynamical Scattering in Cryo-transmission Electron MicroscopyMax Leo Leidl, Sebastian Sturm, Aikaterina Filopoulou, et al.
Ultramicroscopy|May 14, 2013
Measurement of indium concentration profiles and segregation efficiencies from high-angle annular dark field-scanning transmission electron microscopy imagesThorsten Mehrtens, Knut Müller, Marco Schowalter, et al.
Ultramicroscopy|July 5, 2013
Comparison of intensity and absolute contrast of simulated and experimental high-resolution transmission electron microscopy images for different multislice simulation methodsFlorian F Krause, Knut Müller, Dennis Zillmann, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 25, 2023
Systematic Errors of Electric Field Measurements in Ferroelectrics by Unit Cell Averaged Momentum Transfers in STEMAchim Strauch, Benjamin März, Thibaud Denneulin, et al.
Ultramicroscopy|April 2, 2013
Quantitative chemical evaluation of dilute GaNAs using ADF STEM: avoiding surface strain induced artifactsTim Grieb, Knut Müller, Rafael Fritz, et al.
Ultramicroscopy|December 19, 2020
Accurate measurement of strain at interfaces in 4D-STEM: A comparison of various methodsChristoph Mahr, Knut Müller-Caspary, Tim Grieb, et al.
Ultramicroscopy|December 22, 2015
Effects of instrument imperfections on quantitative scanning transmission electron microscopyFlorian F Krause, Marco Schowalter, Tim Grieb, et al.
Pageof 8