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Knut Müller

Showing results (21-30 of 73) with videos related to

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Ultramicroscopy|April 24, 2009
Refinement of the 200 structure factor for GaAs using parallel and convergent beam electron nanodiffraction dataKnut Müller, Marco Schowalter, Jacob Jansen, et al.
Ultramicroscopy|April 25, 2018
Demonstration of a 2 × 2 programmable phase plate for electronsJo Verbeeck, Armand Béché, Knut Müller-Caspary, et al.
Scientific Reports|January 15, 2024
Imaging built-in electric fields and light matter by Fourier-precession TEMTizian Lorenzen, Benjamin März, Tianhao Xue, et al.
Ultramicroscopy|May 29, 2012
Determination of the chemical composition of GaNAs using STEM HAADF imaging and STEM strain state analysisTim Grieb, Knut Müller, Rafael Fritz, et al.
Ultramicroscopy|October 20, 2015
Sample tilt effects on atom column position determination in ABF-STEM imagingDan Zhou, Knut Müller-Caspary, Wilfried Sigle, et al.
Ultramicroscopy|May 14, 2017
Optimization of NBED simulations for disc-detection measurementsTim Grieb, Florian F Krause, Christoph Mahr, et al.
Nanoscale Advances|September 28, 2023
Synthesis and application of spermine-based amphiphilic poly(β-amino ester)s for siRNA deliveryYao Jin, Friederike Adams, Anny Nguyen, et al.
Ultramicroscopy|June 6, 2009
Measurement of specimen thickness and composition in Al(x)Ga(1-x)N/GaN using high-angle annular dark field imagesAndreas Rosenauer, Katharina Gries, Knut Müller, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 1, 2014
Simultaneous quantification of indium and nitrogen concentration in InGaNAs using HAADF-STEMTim Grieb, Knut Müller, Emmanuel Cadel, et al.
ACS Applied Materials & Interfaces|April 26, 2012
Bulk and surface excitons in alloyed and phase-separated ZnO-MgO particulate systemsHuanjun Zhang, Amir R Gheisi, Andreas Sternig, et al.
Pageof 8

Showing results (21-30 of 73) with videos related to

Sort By:
Pageof 8
Ultramicroscopy|April 24, 2009
Refinement of the 200 structure factor for GaAs using parallel and convergent beam electron nanodiffraction dataKnut Müller, Marco Schowalter, Jacob Jansen, et al.
Ultramicroscopy|April 25, 2018
Demonstration of a 2 × 2 programmable phase plate for electronsJo Verbeeck, Armand Béché, Knut Müller-Caspary, et al.
Scientific Reports|January 15, 2024
Imaging built-in electric fields and light matter by Fourier-precession TEMTizian Lorenzen, Benjamin März, Tianhao Xue, et al.
Ultramicroscopy|May 29, 2012
Determination of the chemical composition of GaNAs using STEM HAADF imaging and STEM strain state analysisTim Grieb, Knut Müller, Rafael Fritz, et al.
Ultramicroscopy|October 20, 2015
Sample tilt effects on atom column position determination in ABF-STEM imagingDan Zhou, Knut Müller-Caspary, Wilfried Sigle, et al.
Ultramicroscopy|May 14, 2017
Optimization of NBED simulations for disc-detection measurementsTim Grieb, Florian F Krause, Christoph Mahr, et al.
Nanoscale Advances|September 28, 2023
Synthesis and application of spermine-based amphiphilic poly(β-amino ester)s for siRNA deliveryYao Jin, Friederike Adams, Anny Nguyen, et al.
Ultramicroscopy|June 6, 2009
Measurement of specimen thickness and composition in Al(x)Ga(1-x)N/GaN using high-angle annular dark field imagesAndreas Rosenauer, Katharina Gries, Knut Müller, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 1, 2014
Simultaneous quantification of indium and nitrogen concentration in InGaNAs using HAADF-STEMTim Grieb, Knut Müller, Emmanuel Cadel, et al.
ACS Applied Materials & Interfaces|April 26, 2012
Bulk and surface excitons in alloyed and phase-separated ZnO-MgO particulate systemsHuanjun Zhang, Amir R Gheisi, Andreas Sternig, et al.
Pageof 8