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Knut Müller

Showing results (41-50 of 73) with videos related to

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Ultramicroscopy|May 8, 2022
Angle-dependence of ADF-STEM intensities for chemical analysis of InGaN/GaNTim Grieb, Florian F Krause, Knut Müller-Caspary, et al.
Nature Communications|December 16, 2014
Atomic electric fields revealed by a quantum mechanical approach to electron picodiffractionKnut Müller, Florian F Krause, Armand Béché, et al.
Physical Review Letters|April 2, 2019
Electrical Polarization in AlN/GaN Nanodisks Measured by Momentum-Resolved 4D Scanning Transmission Electron MicroscopyKnut Müller-Caspary, Tim Grieb, Jan Müßener, et al.
Ultramicroscopy|December 31, 2020
Angle-resolved STEM using an iris aperture: Scattering contributions and sources of error for the quantitative analysis in SiTim Grieb, Florian F Krause, Knut Müller-Caspary, et al.
Scientific Reports|November 17, 2016
Materials characterisation by angle-resolved scanning transmission electron microscopyKnut Müller-Caspary, Oliver Oppermann, Tim Grieb, et al.
Nano Letters|November 26, 2024
Molecular Dynamics Simulations Elucidate the Molecular Organization of Poly(beta-amino ester) Based Polyplexes for siRNA DeliveryKatharina M Steinegger, Lars Allmendinger, Sebastian Sturm, et al.
Ultramicroscopy|May 22, 2018
Strain analysis from nano-beam electron diffraction: Influence of specimen tilt and beam convergenceTim Grieb, Florian F Krause, Marco Schowalter, et al.
Ultramicroscopy|October 7, 2018
Influence of distortions of recorded diffraction patterns on strain analysis by nano-beam electron diffractionChristoph Mahr, Knut Müller-Caspary, Robert Ritz, et al.
Nano Letters|July 9, 2014
Wrinkling of atomic planes in ultrathin Au nanowiresAhin Roy, Subhajit Kundu, Knut Müller, et al.
Ultramicroscopy|February 15, 2021
Precise measurement of the electron beam current in a TEMFlorian F Krause, Marco Schowalter, Oliver Oppermann, et al.
Pageof 8

Showing results (41-50 of 73) with videos related to

Sort By:
Pageof 8
Ultramicroscopy|May 8, 2022
Angle-dependence of ADF-STEM intensities for chemical analysis of InGaN/GaNTim Grieb, Florian F Krause, Knut Müller-Caspary, et al.
Nature Communications|December 16, 2014
Atomic electric fields revealed by a quantum mechanical approach to electron picodiffractionKnut Müller, Florian F Krause, Armand Béché, et al.
Physical Review Letters|April 2, 2019
Electrical Polarization in AlN/GaN Nanodisks Measured by Momentum-Resolved 4D Scanning Transmission Electron MicroscopyKnut Müller-Caspary, Tim Grieb, Jan Müßener, et al.
Ultramicroscopy|December 31, 2020
Angle-resolved STEM using an iris aperture: Scattering contributions and sources of error for the quantitative analysis in SiTim Grieb, Florian F Krause, Knut Müller-Caspary, et al.
Scientific Reports|November 17, 2016
Materials characterisation by angle-resolved scanning transmission electron microscopyKnut Müller-Caspary, Oliver Oppermann, Tim Grieb, et al.
Nano Letters|November 26, 2024
Molecular Dynamics Simulations Elucidate the Molecular Organization of Poly(beta-amino ester) Based Polyplexes for siRNA DeliveryKatharina M Steinegger, Lars Allmendinger, Sebastian Sturm, et al.
Ultramicroscopy|May 22, 2018
Strain analysis from nano-beam electron diffraction: Influence of specimen tilt and beam convergenceTim Grieb, Florian F Krause, Marco Schowalter, et al.
Ultramicroscopy|October 7, 2018
Influence of distortions of recorded diffraction patterns on strain analysis by nano-beam electron diffractionChristoph Mahr, Knut Müller-Caspary, Robert Ritz, et al.
Nano Letters|July 9, 2014
Wrinkling of atomic planes in ultrathin Au nanowiresAhin Roy, Subhajit Kundu, Knut Müller, et al.
Ultramicroscopy|February 15, 2021
Precise measurement of the electron beam current in a TEMFlorian F Krause, Marco Schowalter, Oliver Oppermann, et al.
Pageof 8