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Journal of Microscopy
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February 18, 2009
Defocus convergent beam electron diffraction analysis of dislocations in mullite
S Gustafsson, L K L Falk
Ultramicroscopy
|
May 10, 2015
Atom probe tomography of a Ti-Si-Al-C-N coating grown on a cemented carbide substrate
M Thuvander, G Östberg, M Ahlgren, et al.
Ultramicroscopy
|
January 18, 2011
Quantitative atom probe analysis of carbides
M Thuvander, J Weidow, J Angseryd, et al.
Page
of 1
Search research articles
Search
Showing results (1-10 of 3) with videos related to
Sort By:
Page
of 1
Journal of Microscopy
|
February 18, 2009
Defocus convergent beam electron diffraction analysis of dislocations in mullite
S Gustafsson, L K L Falk
Ultramicroscopy
|
May 10, 2015
Atom probe tomography of a Ti-Si-Al-C-N coating grown on a cemented carbide substrate
M Thuvander, G Östberg, M Ahlgren, et al.
Ultramicroscopy
|
January 18, 2011
Quantitative atom probe analysis of carbides
M Thuvander, J Weidow, J Angseryd, et al.
Page
of 1