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Optics Express|June 12, 2008
Systematic errors for a Mueller matrix dual rotating compensator ellipsometerLaurent Broch, Aotmane En Naciri, Luc JohannApplied Optics|June 12, 2010
Second-order systematic errors in Mueller matrix dual rotating compensator ellipsometryLaurent Broch, Aotmane En Naciri, Luc JohannThe Review of Scientific Instruments|July 7, 2007
Real time in situ ellipsometric and gravimetric monitoring for electrochemistry experimentsLaurent Broch, Luc Johann, Nicolas Stein, et al.Applied Optics|May 14, 2020
Morphological and chemical dynamics upon electrochemical cyclic sodiation of electrochromic tungsten oxide coatings extracted by in situ ellipsometryAlexandre Zimmer, Mickaël Gilliot, Laurent Broch, et al.Langmuir : the ACS Journal of Surfaces and Colloids|July 21, 2017
Ellipsometry of Colloidal Solutions: New Experimental Setup and Application to Metallic ColloidsYann Battie, Michel Stchakovsky, Aotmane En Naciri, et al.Optics Letters|March 2, 2019
Coloration mechanism of electrochromic NaxWO3 thin filmsAlexandre Zimmer, Mickaël Gilliot, Manuel Tresse, et al.Pageof 1