Showing results (21-30 of 89) with videos related to

Sort By:
Pageof 9
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 25, 2023
A Retrofittable Photoelectron Gun for Low-Voltage Imaging Applications in the Scanning Electron MicroscopeFrances Quigley, Clive Downing, Cormac McGuinness, et al.
Micron (Oxford, England : 1993)|March 11, 2017
Atomic-resolution chemical mapping of ordered precipitates in Al alloys using energy-dispersive X-ray spectroscopySigurd Wenner, Lewys Jones, Calin D Marioara, et al.
Ultramicroscopy|December 8, 2014
Efficient phase contrast imaging in STEM using a pixelated detector. Part II: optimisation of imaging conditionsHao Yang, Timothy J Pennycook, Peter D Nellist
Ultramicroscopy|September 25, 2016
Enhanced phase contrast transfer using ptychography combined with a pre-specimen phase plate in a scanning transmission electron microscopeHao Yang, Peter Ercius, Peter D Nellist, et al.
ACS Nano|February 2, 2010
Dependence of surface facet period on the diameter of nanowiresFang Li, Peter D Nellist, Christian Lang, et al.
Advanced Structural and Chemical Imaging|June 23, 2018
Maximising the resolving power of the scanning tunneling microscopeLewys Jones, Shuqiu Wang, Xiao Hu, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 29, 2026
Detective Quantum Efficiency-Based Comparison of HRTEM and Ptychography Phase ImagingFelix Bennemann, Angus I Kirkland, David A Muller, et al.
Philosophical Transactions. Series A, Mathematical, Physical, and Engineering Sciences|August 19, 2009
Three-dimensional imaging by optical sectioning in the aberration-corrected scanning transmission electron microscopeG Behan, E C Cosgriff, Angus I Kirkland, et al.
Ultramicroscopy|October 27, 2018
High dose efficiency atomic resolution imaging via electron ptychographyTimothy J Pennycook, Gerardo T Martinez, Peter D Nellist, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 31, 2022
Cost and Capability Compromises in STEM Instrumentation for Low-Voltage ImagingFrances Quigley, Patrick McBean, Peter O'Donovan, et al.
Pageof 9