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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 29, 2026
Relaxing Direct Ptychography Sampling Requirements via Parallax Imaging InsightsGeorgios Varnavides, Julie Marie Bekkevold, Stephanie M Ribet, et al.Ultramicroscopy|September 28, 2024
On the temporal transfer function in STEM imaging from finite detector response timeJonathan J P Peters, Tiarnan Mullarkey, Julie Marie Bekkevold, et al.Nature Communications|August 25, 2023
Electron counting detectors in scanning transmission electron microscopy via hardware signal processingJonathan J P Peters, Tiarnan Mullarkey, Emma Hedley, et al.The Journal of Physical Chemistry. C, Nanomaterials and Interfaces|August 29, 2017
Electrochemical CO Oxidation at Platinum on Carbon Studied through Analysis of Anomalous in Situ IR SpectraIan J McPherson, Philip A Ash, Lewys Jones, et al.Physical Chemistry Chemical Physics : PCCP|December 22, 2009
Processing and characterisation of Mo6S2I8 nanowiresManuel Schnabel, Rebecca J Nicholls, Christoph G Salzmann, et al.Nature Communications|August 2, 2017
Electron ptychographic microscopy for three-dimensional imagingSi Gao, Peng Wang, Fucai Zhang, et al.Ultramicroscopy|December 28, 2020
Contrast transfer and noise considerations in focused-probe electron ptychographyColum M O'Leary, Gerardo T Martinez, Emanuela Liberti, et al.Langmuir : the ACS Journal of Surfaces and Colloids|September 27, 2012
Self-assembly of LiMo3Se3 nanowire networks from nanoscale building-blocks in solutionJohn G Sheridan, Andreas Heidelberg, Dermot F Brougham, et al.Journal of Physics. Condensed Matter : an Institute of Physics Journal|February 27, 2018
Ideal versus real: simulated annealing of experimentally derived and geometric platinum nanoparticlesTom Ellaby, Jolyon Aarons, Aakash Varambhia, et al.Physical Review Letters|September 28, 2010
Nanoscale energy-filtered scanning confocal electron microscopy using a double-aberration-corrected transmission electron microscopePeng Wang, Gavin Behan, Masaki Takeguchi, et al.Pageof 9