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Applied Optics|June 12, 2010
Second-order systematic errors in Mueller matrix dual rotating compensator ellipsometryLaurent Broch, Aotmane En Naciri, Luc JohannOptics Express|June 12, 2008
Systematic errors for a Mueller matrix dual rotating compensator ellipsometerLaurent Broch, Aotmane En Naciri, Luc JohannThe Review of Scientific Instruments|July 7, 2007
Real time in situ ellipsometric and gravimetric monitoring for electrochemistry experimentsLaurent Broch, Luc Johann, Nicolas Stein, et al.Pageof 1