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Ultramicroscopy|February 7, 2017
Quantification by aberration corrected (S)TEM of boundaries formed by symmetry breaking phase transformationsD Schryvers, E K H Salje, M Nishida, et al.Ultramicroscopy|February 8, 2018
Thickness dependence of scattering cross-sections in quantitative scanning transmission electron microscopyG T Martinez, K H W van den Bos, M Alania, et al.Ultramicroscopy|December 14, 2018
The atomic lensing model: New opportunities for atom-by-atom metrology of heterogeneous nanomaterialsK H W van den Bos, L Janssens, A De Backer, et al.Ultramicroscopy|August 31, 2015
Quantitative STEM normalisation: The importance of the electron fluxG T Martinez, L Jones, A De Backer, et al.Ultramicroscopy|September 23, 2016
StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy imagesA De Backer, K H W van den Bos, W Van den Broek, et al.Ultramicroscopy|June 16, 2009
Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopyS Van Aert, J Verbeeck, R Erni, et al.Ultramicroscopy|December 17, 2014
Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-countingA De Backer, G T Martinez, K E MacArthur, et al.Ultramicroscopy|November 20, 2021
Dynamical diffraction of high-energy electrons investigated by focal series momentum-resolved scanning transmission electron microscopy at atomic resolutionH L Robert, I Lobato, F J Lyu, et al.Physical Review Letters|August 18, 2018
Single Atom Detection from Low Contrast-to-Noise Ratio Electron Microscopy ImagesJ Fatermans, A J den Dekker, K Müller-Caspary, et al.Pageof 21