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Updated: Mar 8, 2026

Picometer-Precision Atomic Position Tracking through Electron Microscopy
Published on: July 3, 2021
Quantification by aberration corrected (S)TEM of boundaries formed by symmetry breaking phase transformations
D Schryvers1, E K H Salje2, M Nishida3
1EMAT, University of Antwerp, Groenenborgerlaan 171, B-2020 Antwerp, Belgium.
Abstract:
The present contribution gives a review of recent quantification work of atom displacements, atom site occupations and level of crystallinity in various systems and based on aberration corrected HR(S)TEM images. Depending on the case studied, picometer range precisions for individual distances can be obtained, boundary widths at the unit cell level determined or statistical evolutions of fractions of the ordered areas calculated. In all of these cases, these quantitative measures imply new routes for the applications of the respective materials.
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