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M E Pedinoff

Showing results (1-10 of 5) with videos related to

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Applied Optics|March 9, 2010
Strain induced anisotropy in As(2)S(3), As(2)Se(3), and ZnSe films on KCI substrates via 10.6-microm and 0.6328-microm ellipsometer measurements and 0.6328-microm reflector measurementsM E Pedinoff, O M Stafsudd
Applied Optics|April 8, 2010
Multiple angle ellipsometric analysis of surface layers and surface layer contaminantsM E Pedinoff, O M Stafsudd
Applied Optics|February 23, 2010
Refractive indices of ir materials: 10.6-microm ellipsometer measurementsM E Pedinoff, M Braunstein, O M Stafsudd
Applied Optics|April 17, 2010
Strain-induced anisotropy measurement in oxide films grown on siliconM E Pedinoff, D C Mayer, O M Stafsudd, et al.
Applied Optics|February 19, 2010
Coherent optical adaptive techniques: design and performance of an 18-element visible multidither COAT systemJ E Pearson, W B Bridges, S Hansen, et al.
Pageof 1

Showing results (1-10 of 5) with videos related to

Sort By:
Pageof 1
Applied Optics|March 9, 2010
Strain induced anisotropy in As(2)S(3), As(2)Se(3), and ZnSe films on KCI substrates via 10.6-microm and 0.6328-microm ellipsometer measurements and 0.6328-microm reflector measurementsM E Pedinoff, O M Stafsudd
Applied Optics|April 8, 2010
Multiple angle ellipsometric analysis of surface layers and surface layer contaminantsM E Pedinoff, O M Stafsudd
Applied Optics|February 23, 2010
Refractive indices of ir materials: 10.6-microm ellipsometer measurementsM E Pedinoff, M Braunstein, O M Stafsudd
Applied Optics|April 17, 2010
Strain-induced anisotropy measurement in oxide films grown on siliconM E Pedinoff, D C Mayer, O M Stafsudd, et al.
Applied Optics|February 19, 2010
Coherent optical adaptive techniques: design and performance of an 18-element visible multidither COAT systemJ E Pearson, W B Bridges, S Hansen, et al.
Pageof 1