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Applied Optics|February 21, 2008
Low-coherence fiber-optic sensor with a large numerical aperture for topographic measurementsR Windecker, M Fleischer, H J TizianiApplied Optics|March 22, 2008
Theoretical limits of scanning white-light interferometry signal evaluation algorithmsM Fleischer, R Windecker, H J TizianiApplied Optics|March 14, 2008
Fast algorithms for data reduction in modern optical three-dimensional profile measurement systems with MMX technologyM Fleischer, R Windecker, H J TizianiApplied Optics|November 10, 2010
Semispatial, robust, and accurate phase evaluation algorithmR Windecker, H J TizianiApplied Optics|November 6, 2010
Topometry of technical and biological objects by fringe projectionR Windecker, H J TizianiApplied Optics|March 6, 2008
Optical roughness measurements with fringe projectionR Windecker, S Franz, H J TizianiApplied Optics|March 8, 2008
Topograph for inspection of engine cylinder wallsS Franz, K Leonhardt, R Windecker, et al.Applied Optics|March 24, 2010
Vibration analysis by speckle techniques in real timeH J Tiziani, J KlenkApplied Optics|October 22, 2010
Double-pulse electronic speckle interferometry for vibration analysisG Pedrini, H J TizianiPageof 24