Fast algorithms for data reduction in modern optical three-dimensional profile measurement systems with MMX

M Fleischer1, R Windecker, H J Tiziani

  • 1Institut für Technische Optik, Universität Stuttgart, D-70569 Stuttgart, Germany. fleischer@ito.uni-stuttgart.de

Applied Optics
|March 14, 2008
PubMed
Summary

Modern microprocessors with multimedia extended (MMX) instructions accelerate 3D microstructure analysis. This enables faster, more complex algorithms for confocal microscopy and white-light interferometry on standard hardware.

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