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M J Offside
M G Somekh

Applied optics

Showing results (1-10 of 9) with videos related to

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Applied Optics|August 25, 2010
Interferometric scanning optical microscope for surface characterizationM J Offside, M G Somekh
Applied Optics|September 24, 2010
Extended-focus phase imaging with an interferometric confocal microscopeR D Holmes, M G Somekh
Applied Optics|June 21, 2007
Imaging performance of widefield solid immersion lens microscopyJ Zhang, C W See, M G Somekh
Applied Optics|November 6, 2010
Scanning heterodyne confocal differential phase and intensity microscopeM G Somekh, M S Valera, R K Appel
Applied Optics|March 1, 1997
Effects of polarization state and scatterer concentration on optical imaging through scattering mediaS P Morgan, M P Khong, M G Somekh
Applied Optics|December 15, 2010
Scanning optical microellipsometer for pure surface profilingC W See, M G Somekh, R D Holmes
Applied Optics|February 9, 2008
Single-probe-beam differential amplitude and phase-scanning interferometerM B Suddendorf, M G Somekh, C W See
Applied Optics|March 21, 2008
High-resolution scanning surface-plasmon microscopyM G Somekh, S Liu, T S Velinov, et al.
Applied Optics|February 28, 2008
Ultrastable absolute-phase common-path optical profiler based on computer-generated holographyN B Sawyer, C W See, M Clark, et al.
Pageof 1

Showing results (1-10 of 9) with videos related to

Sort By:
Pageof 1
Applied Optics|August 25, 2010
Interferometric scanning optical microscope for surface characterizationM J Offside, M G Somekh
Applied Optics|September 24, 2010
Extended-focus phase imaging with an interferometric confocal microscopeR D Holmes, M G Somekh
Applied Optics|June 21, 2007
Imaging performance of widefield solid immersion lens microscopyJ Zhang, C W See, M G Somekh
Applied Optics|November 6, 2010
Scanning heterodyne confocal differential phase and intensity microscopeM G Somekh, M S Valera, R K Appel
Applied Optics|March 1, 1997
Effects of polarization state and scatterer concentration on optical imaging through scattering mediaS P Morgan, M P Khong, M G Somekh
Applied Optics|December 15, 2010
Scanning optical microellipsometer for pure surface profilingC W See, M G Somekh, R D Holmes
Applied Optics|February 9, 2008
Single-probe-beam differential amplitude and phase-scanning interferometerM B Suddendorf, M G Somekh, C W See
Applied Optics|March 21, 2008
High-resolution scanning surface-plasmon microscopyM G Somekh, S Liu, T S Velinov, et al.
Applied Optics|February 28, 2008
Ultrastable absolute-phase common-path optical profiler based on computer-generated holographyN B Sawyer, C W See, M Clark, et al.
Pageof 1