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M Stöger-Pollach

Showing results (11-20 of 30) with videos related to

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Micron (Oxford, England : 1993)|August 30, 2008
Measuring the dielectric constant of materials from valence EELSP L Potapov, H-J Engelmann, E Zschech, et al.
Ultramicroscopy|December 7, 2007
Magnetic circular dichroism in electron energy loss spectrometryC Hébert, P Schattschneider, S Rubino, et al.
Micron (Oxford, England : 1993)|February 15, 2011
EMCD real space maps of Magnetospirillum magnetotacticumM Stöger-Pollach, C D Treiber, G P Resch, et al.
Ultramicroscopy|March 31, 2012
Sub-nanometer free electrons with topological chargeP Schattschneider, M Stöger-Pollach, S Löffler, et al.
Microelectronic Engineering|April 5, 2011
Schottky barrier SOI-MOSFETs with high-k La(2)O(3)/ZrO(2) gate dielectricsC Henkel, S Abermann, O Bethge, et al.
The Journal of Physical Chemistry. C, Nanomaterials and Interfaces|June 21, 2013
The Role of Defects in the Local Reaction Kinetics of CO Oxidation on Low-Index Pd SurfacesD Vogel, C Spiel, M Schmid, et al.
Micron (Oxford, England : 1993)|March 23, 2006
Cerenkov losses: a limit for bandgap determination and Kramers-Kronig analysisM Stöger-Pollach, H Franco, P Schattschneider, et al.
Catalysis Letters|May 2, 2020
Hydrogen Oxidation on Stepped Rh Surfaces: µm-Scale versus NanoscaleM Datler, I Bespalov, S Buhr, et al.
Nature Communications|August 9, 2014
Imaging the dynamics of free-electron Landau statesP Schattschneider, Th Schachinger, M Stöger-Pollach, et al.
Science (New York, N.Y.)|May 21, 2021
Resolving multifrequential oscillations and nanoscale interfacet communication in single-particle catalysisY Suchorski, J Zeininger, S Buhr, et al.
Pageof 3

Showing results (11-20 of 30) with videos related to

Sort By:
Pageof 3
Micron (Oxford, England : 1993)|August 30, 2008
Measuring the dielectric constant of materials from valence EELSP L Potapov, H-J Engelmann, E Zschech, et al.
Ultramicroscopy|December 7, 2007
Magnetic circular dichroism in electron energy loss spectrometryC Hébert, P Schattschneider, S Rubino, et al.
Micron (Oxford, England : 1993)|February 15, 2011
EMCD real space maps of Magnetospirillum magnetotacticumM Stöger-Pollach, C D Treiber, G P Resch, et al.
Ultramicroscopy|March 31, 2012
Sub-nanometer free electrons with topological chargeP Schattschneider, M Stöger-Pollach, S Löffler, et al.
Microelectronic Engineering|April 5, 2011
Schottky barrier SOI-MOSFETs with high-k La(2)O(3)/ZrO(2) gate dielectricsC Henkel, S Abermann, O Bethge, et al.
The Journal of Physical Chemistry. C, Nanomaterials and Interfaces|June 21, 2013
The Role of Defects in the Local Reaction Kinetics of CO Oxidation on Low-Index Pd SurfacesD Vogel, C Spiel, M Schmid, et al.
Micron (Oxford, England : 1993)|March 23, 2006
Cerenkov losses: a limit for bandgap determination and Kramers-Kronig analysisM Stöger-Pollach, H Franco, P Schattschneider, et al.
Catalysis Letters|May 2, 2020
Hydrogen Oxidation on Stepped Rh Surfaces: µm-Scale versus NanoscaleM Datler, I Bespalov, S Buhr, et al.
Nature Communications|August 9, 2014
Imaging the dynamics of free-electron Landau statesP Schattschneider, Th Schachinger, M Stöger-Pollach, et al.
Science (New York, N.Y.)|May 21, 2021
Resolving multifrequential oscillations and nanoscale interfacet communication in single-particle catalysisY Suchorski, J Zeininger, S Buhr, et al.
Pageof 3