M T Björk - JoVE Visualize

Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Policies

Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Policies

Filters

M T Björk

Showing results (1-10 of 3) with videos related to

Pageof 1

Sort By:

Nano Letters|March 9, 2006

InAs1-xPx nanowires for device engineeringA I Persson, M T Björk, S Jeppesen, et al.

Nano Letters|January 2, 2018

GaAs Nanowire pn-Junctions Produced by Low-Cost and High-Throughput AerotaxyE Barrigón, O Hultin, D Lindgren, et al.

Nanotechnology|October 5, 2010

Solid-state diffusion as an efficient doping method for silicon nanowires and nanowire field effect transistorsK E Moselund, H Ghoneim, H Schmid, et al.

Pageof 1

Search research articles

Showing results (1-10 of 3) with videos related to

Sort By:

Pageof 1

Nano Letters|March 9, 2006

InAs1-xPx nanowires for device engineeringA I Persson, M T Björk, S Jeppesen, et al.

Nano Letters|January 2, 2018

GaAs Nanowire pn-Junctions Produced by Low-Cost and High-Throughput AerotaxyE Barrigón, O Hultin, D Lindgren, et al.

Nanotechnology|October 5, 2010

Solid-state diffusion as an efficient doping method for silicon nanowires and nanowire field effect transistorsK E Moselund, H Ghoneim, H Schmid, et al.

Pageof 1