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Marco Schowalter

Showing results (11-20 of 54) with videos related to

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Ultramicroscopy|July 5, 2013
Comparison of intensity and absolute contrast of simulated and experimental high-resolution transmission electron microscopy images for different multislice simulation methodsFlorian F Krause, Knut Müller, Dennis Zillmann, et al.
Small (Weinheim an Der Bergstrasse, Germany)|March 10, 2025
Controlled Synthesis of Copper Sulfide Nanoparticles in Oxygen-Deficient Conditions Using Flame Spray Pyrolysis (FSP) and Its Potential ApplicationMuhammad Ali Martuza, Suman Pokhrel, Jakob Stahl, et al.
Ultramicroscopy|April 17, 2018
Using molecular dynamics for multislice TEM simulation of thermal diffuse scattering in AlGaNFlorian F Krause, Dennis Bredemeier, Marco Schowalter, et al.
Ultramicroscopy|May 14, 2013
Measurement of indium concentration profiles and segregation efficiencies from high-angle annular dark field-scanning transmission electron microscopy imagesThorsten Mehrtens, Knut Müller, Marco Schowalter, et al.
Ultramicroscopy|April 2, 2013
Quantitative chemical evaluation of dilute GaNAs using ADF STEM: avoiding surface strain induced artifactsTim Grieb, Knut Müller, Rafael Fritz, et al.
Ultramicroscopy|December 19, 2020
Accurate measurement of strain at interfaces in 4D-STEM: A comparison of various methodsChristoph Mahr, Knut Müller-Caspary, Tim Grieb, et al.
Ultramicroscopy|December 22, 2015
Effects of instrument imperfections on quantitative scanning transmission electron microscopyFlorian F Krause, Marco Schowalter, Tim Grieb, et al.
Ultramicroscopy|April 24, 2009
Refinement of the 200 structure factor for GaAs using parallel and convergent beam electron nanodiffraction dataKnut Müller, Marco Schowalter, Jacob Jansen, et al.
Ultramicroscopy|May 28, 2021
Accuracy and precision of position determination in ISTEM imaging of BaTiO<sub>3</sub>Dennis Marquardt, Marco Schowalter, Florian F Krause, et al.
Ultramicroscopy|June 6, 2009
Measurement of specimen thickness and composition in Al(x)Ga(1-x)N/GaN using high-angle annular dark field imagesAndreas Rosenauer, Katharina Gries, Knut Müller, et al.
Pageof 6

Showing results (11-20 of 54) with videos related to

Sort By:
Pageof 6
Ultramicroscopy|July 5, 2013
Comparison of intensity and absolute contrast of simulated and experimental high-resolution transmission electron microscopy images for different multislice simulation methodsFlorian F Krause, Knut Müller, Dennis Zillmann, et al.
Small (Weinheim an Der Bergstrasse, Germany)|March 10, 2025
Controlled Synthesis of Copper Sulfide Nanoparticles in Oxygen-Deficient Conditions Using Flame Spray Pyrolysis (FSP) and Its Potential ApplicationMuhammad Ali Martuza, Suman Pokhrel, Jakob Stahl, et al.
Ultramicroscopy|April 17, 2018
Using molecular dynamics for multislice TEM simulation of thermal diffuse scattering in AlGaNFlorian F Krause, Dennis Bredemeier, Marco Schowalter, et al.
Ultramicroscopy|May 14, 2013
Measurement of indium concentration profiles and segregation efficiencies from high-angle annular dark field-scanning transmission electron microscopy imagesThorsten Mehrtens, Knut Müller, Marco Schowalter, et al.
Ultramicroscopy|April 2, 2013
Quantitative chemical evaluation of dilute GaNAs using ADF STEM: avoiding surface strain induced artifactsTim Grieb, Knut Müller, Rafael Fritz, et al.
Ultramicroscopy|December 19, 2020
Accurate measurement of strain at interfaces in 4D-STEM: A comparison of various methodsChristoph Mahr, Knut Müller-Caspary, Tim Grieb, et al.
Ultramicroscopy|December 22, 2015
Effects of instrument imperfections on quantitative scanning transmission electron microscopyFlorian F Krause, Marco Schowalter, Tim Grieb, et al.
Ultramicroscopy|April 24, 2009
Refinement of the 200 structure factor for GaAs using parallel and convergent beam electron nanodiffraction dataKnut Müller, Marco Schowalter, Jacob Jansen, et al.
Ultramicroscopy|May 28, 2021
Accuracy and precision of position determination in ISTEM imaging of BaTiO<sub>3</sub>Dennis Marquardt, Marco Schowalter, Florian F Krause, et al.
Ultramicroscopy|June 6, 2009
Measurement of specimen thickness and composition in Al(x)Ga(1-x)N/GaN using high-angle annular dark field imagesAndreas Rosenauer, Katharina Gries, Knut Müller, et al.
Pageof 6