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Marwan S Mousa

Showing results (1-10 of 16) with videos related to

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Ultramicroscopy|February 8, 2011
Characteristics of a high brightness gaseous field ion source employing tungsten-carbon doped NiAl needlesMarwan S Mousa
Ultramicroscopy|April 20, 2013
Information extraction from FN plots of tungsten microemittersKhalil O Mussa, Marwan S Mousa, Andreas Fischer
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 21, 2016
Microwave Frequency Comb from a Semiconductor in a Scanning Tunneling MicroscopeMark J Hagmann, Dmitry A Yarotski, Marwan S Mousa
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 15, 2019
Simulation and Analysis of Methods for Scanning Tunneling Microscopy Feedback ControlJeremy Wiedemeier, Greg Spencer, Mark J Hagmann, et al.
Ultramicroscopy|November 26, 2022
Field electron emission from tungsten micro-tips coated with various thicknesses of polystyrene nanolayers: Characteristics & analysisMo'tasem Alabth, Moneeb T M Shatnawi, Mohammad M Allaham, et al.
Ultramicroscopy|February 17, 2022
Application of Murphy - Good Plot Parameters Extraction Method on Electron Emission from Carbon FibersMazen A Madanat, Ahmed A Al-Tabbakh, Mohammed Alsa'eed, et al.
ACS Omega|February 16, 2026
Role of Buffer Layers in Defect Chemistry and Parasitic Phase Formation of BiFeO<sub>3</sub> Films on SiliconSaleh H Fawaeer, Wala' M Al-Qaisi, Vlasta Sedláková, et al.
Environmental Science and Pollution Research International|March 27, 2025
Efficient uranium capture from water with date palm seed biomass: green remediationMohammed A Al-Anber, Hadeel Almazaydeh, Idrees F Al-Momani, et al.
Nanomaterials (Basel, Switzerland)|July 8, 2020
Field Emission Properties of Polymer Graphite Tips Prepared by Membrane Electrochemical EtchingAlexandr Knápek, Rashid Dallaev, Daniel Burda, et al.
Ultramicroscopy|February 27, 2026
An empirical X-ray K-Ratio framework for thickness measurement of 2D Si and SiO₂ thin films and SiO<sub>2</sub> layer on Si substrateAhmad M D Assa'd Jaber, Adel A Shaheen, Maryam W N Al-Mazaydeh, et al.
Pageof 2

Showing results (1-10 of 16) with videos related to

Sort By:
Pageof 2
Ultramicroscopy|February 8, 2011
Characteristics of a high brightness gaseous field ion source employing tungsten-carbon doped NiAl needlesMarwan S Mousa
Ultramicroscopy|April 20, 2013
Information extraction from FN plots of tungsten microemittersKhalil O Mussa, Marwan S Mousa, Andreas Fischer
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 21, 2016
Microwave Frequency Comb from a Semiconductor in a Scanning Tunneling MicroscopeMark J Hagmann, Dmitry A Yarotski, Marwan S Mousa
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 15, 2019
Simulation and Analysis of Methods for Scanning Tunneling Microscopy Feedback ControlJeremy Wiedemeier, Greg Spencer, Mark J Hagmann, et al.
Ultramicroscopy|November 26, 2022
Field electron emission from tungsten micro-tips coated with various thicknesses of polystyrene nanolayers: Characteristics & analysisMo'tasem Alabth, Moneeb T M Shatnawi, Mohammad M Allaham, et al.
Ultramicroscopy|February 17, 2022
Application of Murphy - Good Plot Parameters Extraction Method on Electron Emission from Carbon FibersMazen A Madanat, Ahmed A Al-Tabbakh, Mohammed Alsa'eed, et al.
ACS Omega|February 16, 2026
Role of Buffer Layers in Defect Chemistry and Parasitic Phase Formation of BiFeO<sub>3</sub> Films on SiliconSaleh H Fawaeer, Wala' M Al-Qaisi, Vlasta Sedláková, et al.
Environmental Science and Pollution Research International|March 27, 2025
Efficient uranium capture from water with date palm seed biomass: green remediationMohammed A Al-Anber, Hadeel Almazaydeh, Idrees F Al-Momani, et al.
Nanomaterials (Basel, Switzerland)|July 8, 2020
Field Emission Properties of Polymer Graphite Tips Prepared by Membrane Electrochemical EtchingAlexandr Knápek, Rashid Dallaev, Daniel Burda, et al.
Ultramicroscopy|February 27, 2026
An empirical X-ray K-Ratio framework for thickness measurement of 2D Si and SiO₂ thin films and SiO<sub>2</sub> layer on Si substrateAhmad M D Assa'd Jaber, Adel A Shaheen, Maryam W N Al-Mazaydeh, et al.
Pageof 2