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Ultramicroscopy|February 13, 2010
Correction of distortion due to thermal drift in scanning probe microscopyBrian S Salmons, Daniel R Katz, Matthew L Trawick
The Review of Scientific Instruments|September 4, 2012
Three-axis correction of distortion due to positional drift in scanning probe microscopyNathan D Follin, Keefer D Taylor, Christopher J Musalo, et al.
Physical Review Letters|January 24, 2015
Static and dynamic aspects of black silicon formationDavid Abi Saab, Philippe Basset, Matthew J Pierotti, et al.
Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics|August 11, 2005
Ordering mechanisms in two-dimensional sphere-forming block copolymersDaniel A Vega, Christopher K Harrison, Dan E Angelescu, et al.
Scanning|March 12, 2003
Correction for piezoelectric creep in scanning probe microscopy images using polynomial mappingMatthew L Trawick, Mischa Megens, Christopher Harrison, et al.
Macromolecular Rapid Communications|May 19, 2011
Combinatorial mapping of substrate step edge effects on diblock copolymer thin film morphology and orientationNathaniel T Lawrence, Jill M Kehoe, David B Hoffman, et al.
Langmuir : the ACS Journal of Surfaces and Colloids|August 15, 2009
Distance dependence of electron transfer kinetics for azurin protein adsorbed to monolayer protected nanoparticle film assembliesMorgan L Vargo, Chris P Gulka, John K Gerig, et al.
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