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Michael Deimetry

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 16, 2025
Dopant Site Occupancy Determined by Core-Loss-Filtered, Position-Averaged Convergent Beam Electron DiffractionMichael Deimetry, Timothy C Petersen, Matthew Weyland, et al.
Journal of Microscopy|February 19, 2026
A Bayesian approach to spectroscopic depth sectioning for locating dopant atomsMichael Deimetry, Timothy C Petersen, Matthew Weyland, et al.
Ultramicroscopy|August 30, 2024
Differential phase contrast from electrons that cause inner shell ionizationMichael Deimetry, Timothy C Petersen, Hamish G Brown, et al.
Pageof 1

Showing results (1-10 of 3) with videos related to

Sort By:
Pageof 1
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 16, 2025
Dopant Site Occupancy Determined by Core-Loss-Filtered, Position-Averaged Convergent Beam Electron DiffractionMichael Deimetry, Timothy C Petersen, Matthew Weyland, et al.
Journal of Microscopy|February 19, 2026
A Bayesian approach to spectroscopic depth sectioning for locating dopant atomsMichael Deimetry, Timothy C Petersen, Matthew Weyland, et al.
Ultramicroscopy|August 30, 2024
Differential phase contrast from electrons that cause inner shell ionizationMichael Deimetry, Timothy C Petersen, Hamish G Brown, et al.
Pageof 1