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Michael T Postek

Showing results (1-10 of 24) with videos related to

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Journal of Research of the National Institute of Standards and Technology|February 8, 2024
Critical Issues in Scanning Electron Microscope MetrologyMichael T Postek
Proceedings of Spie--The International Society for Optical Engineering|January 28, 2025
Nanomanufacturing Concerns about Measurements Made in the SEM Part V: Dealing with NoiseMichael T Postek, András E Vladár
Scanning|February 22, 2013
Does your SEM really tell the truth?--How would you know? Part 1Michael T Postek, András E Vladár
Proceedings of Spie--The International Society for Optical Engineering|July 1, 2017
Nanomanufacturing Concerns about Measurements Made in the SEM Part IV: Charging and its MitigationMichael T Postek, András E Vladár
Proceedings of Spie--The International Society for Optical Engineering|July 1, 2017
Does Your SEM Really Tell the Truth?-How Would You Know? Part 4: Charging and its MitigationMichael T Postek, András E Vladár
Proceedings of Spie--The International Society for Optical Engineering|December 12, 2017
Update on Bio-Refining and Nanocellulose Composite Materials ManufacturingMichael T Postek, Dianne L Poster
Scanning|June 2, 2011
Modeling for accurate dimensional scanning electron microscope metrology: then and nowMichael T Postek, András E Vladár
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 3, 2010
Real-time scanning charged-particle microscope image composition with correction of driftPetr Cizmar, András E Vladár, Michael T Postek
Scanning|October 30, 2013
Does your SEM really tell the truth? How would you know? Part 2Michael T Postek, András E Vladár, Kavuri P Purushotham
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 26, 2016
Comparison of Electron Imaging Modes for Dimensional Measurements in the Scanning Electron MicroscopeMichael T Postek, András E Vladár, John S Villarrubia, et al.
Pageof 3

Showing results (1-10 of 24) with videos related to

Sort By:
Pageof 3
Journal of Research of the National Institute of Standards and Technology|February 8, 2024
Critical Issues in Scanning Electron Microscope MetrologyMichael T Postek
Proceedings of Spie--The International Society for Optical Engineering|January 28, 2025
Nanomanufacturing Concerns about Measurements Made in the SEM Part V: Dealing with NoiseMichael T Postek, András E Vladár
Scanning|February 22, 2013
Does your SEM really tell the truth?--How would you know? Part 1Michael T Postek, András E Vladár
Proceedings of Spie--The International Society for Optical Engineering|July 1, 2017
Nanomanufacturing Concerns about Measurements Made in the SEM Part IV: Charging and its MitigationMichael T Postek, András E Vladár
Proceedings of Spie--The International Society for Optical Engineering|July 1, 2017
Does Your SEM Really Tell the Truth?-How Would You Know? Part 4: Charging and its MitigationMichael T Postek, András E Vladár
Proceedings of Spie--The International Society for Optical Engineering|December 12, 2017
Update on Bio-Refining and Nanocellulose Composite Materials ManufacturingMichael T Postek, Dianne L Poster
Scanning|June 2, 2011
Modeling for accurate dimensional scanning electron microscope metrology: then and nowMichael T Postek, András E Vladár
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 3, 2010
Real-time scanning charged-particle microscope image composition with correction of driftPetr Cizmar, András E Vladár, Michael T Postek
Scanning|October 30, 2013
Does your SEM really tell the truth? How would you know? Part 2Michael T Postek, András E Vladár, Kavuri P Purushotham
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 26, 2016
Comparison of Electron Imaging Modes for Dimensional Measurements in the Scanning Electron MicroscopeMichael T Postek, András E Vladár, John S Villarrubia, et al.
Pageof 3