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Michael Tanksalvala

Showing results (1-10 of 8) with videos related to

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Optics Express|October 14, 2022
High-resolution, wavefront-sensing, full-field polarimetry of arbitrary beams using phase retrievalMatthew N Jacobs, Yuka Esashi, Nicholas W Jenkins, et al.
Optics Express|March 27, 2021
Coherent Fourier scatterometry using orbital angular momentum beams for defect detectionBin Wang, Michael Tanksalvala, Zhe Zhang, et al.
The Review of Scientific Instruments|December 18, 2023
Tabletop extreme ultraviolet reflectometer for quantitative nanoscale reflectometry, scatterometry, and imagingYuka Esashi, Nicholas W Jenkins, Yunzhe Shao, et al.
Ultramicroscopy|September 16, 2017
Multiple beam ptychography for large field-of-view, high throughput, quantitative phase contrast imagingCharles Bevis, Robert Karl, Jonathan Reichanadter, et al.
Optics Express|December 25, 2015
Spatial, spectral, and polarization multiplexed ptychographyRobert Karl, Charles Bevis, Raymond Lopez-Rios, et al.
Optics Express|October 15, 2022
Temporal and spectral multiplexing for EUV multibeam ptychography with a high harmonic light sourceNathan J Brooks, Bin Wang, Iona Binnie, et al.
Science Advances|October 23, 2018
Full-field imaging of thermal and acoustic dynamics in an individual nanostructure using tabletop high harmonic beamsRobert M Karl, Giulia F Mancini, Joshua L Knobloch, et al.
Science Advances|February 11, 2021
Nondestructive, high-resolution, chemically specific 3D nanostructure characterization using phase-sensitive EUV imaging reflectometryMichael Tanksalvala, Christina L Porter, Yuka Esashi, et al.
Pageof 1

Showing results (1-10 of 8) with videos related to

Sort By:
Pageof 1
Optics Express|October 14, 2022
High-resolution, wavefront-sensing, full-field polarimetry of arbitrary beams using phase retrievalMatthew N Jacobs, Yuka Esashi, Nicholas W Jenkins, et al.
Optics Express|March 27, 2021
Coherent Fourier scatterometry using orbital angular momentum beams for defect detectionBin Wang, Michael Tanksalvala, Zhe Zhang, et al.
The Review of Scientific Instruments|December 18, 2023
Tabletop extreme ultraviolet reflectometer for quantitative nanoscale reflectometry, scatterometry, and imagingYuka Esashi, Nicholas W Jenkins, Yunzhe Shao, et al.
Ultramicroscopy|September 16, 2017
Multiple beam ptychography for large field-of-view, high throughput, quantitative phase contrast imagingCharles Bevis, Robert Karl, Jonathan Reichanadter, et al.
Optics Express|December 25, 2015
Spatial, spectral, and polarization multiplexed ptychographyRobert Karl, Charles Bevis, Raymond Lopez-Rios, et al.
Optics Express|October 15, 2022
Temporal and spectral multiplexing for EUV multibeam ptychography with a high harmonic light sourceNathan J Brooks, Bin Wang, Iona Binnie, et al.
Science Advances|October 23, 2018
Full-field imaging of thermal and acoustic dynamics in an individual nanostructure using tabletop high harmonic beamsRobert M Karl, Giulia F Mancini, Joshua L Knobloch, et al.
Science Advances|February 11, 2021
Nondestructive, high-resolution, chemically specific 3D nanostructure characterization using phase-sensitive EUV imaging reflectometryMichael Tanksalvala, Christina L Porter, Yuka Esashi, et al.
Pageof 1