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Min-Hyun Lee

Showing results (11-20 of 19) with videos related to

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Nano Letters|October 10, 2025
Nanoscale Dynamics of Buried Charge Trap in Oxide-Nitride-Oxide Stacks Investigated Using Kelvin Probe Force MicroscopySungmin Yoon, Seokhoon Choi, Min-Hyun Lee, et al.
ACS Applied Materials & Interfaces|April 4, 2025
Analysis of the Ambipolar Conduction of Tin Monoxide Thin-Film Transistors with Indium Tin Oxide ElectrodesSahngik A Mun, Seoryong Park, Min-Hyun Lee, et al.
Scientific Reports|February 11, 2016
Thickness scaling of atomic-layer-deposited HfO2 films and their application to wafer-scale graphene tunnelling transistorsSeong-Jun Jeong, Yeahyun Gu, Jinseong Heo, et al.
Scientific Reports|December 16, 2014
A low-noise solid-state nanopore platform based on a highly insulating substrateMin-Hyun Lee, Ashvani Kumar, Kyeong-Beom Park, et al.
Advanced Materials (Deerfield Beach, Fla.)|September 16, 2020
High-Throughput Growth of Wafer-Scale Monolayer Transition Metal Dichalcogenide via Vertical Ostwald RipeningMinsu Seol, Min-Hyun Lee, Haeryong Kim, et al.
Nano Letters|July 24, 2018
Two-Dimensional Materials Inserted at the Metal/Semiconductor Interface: Attractive Candidates for Semiconductor Device ContactsMin-Hyun Lee, Yeonchoo Cho, Kyung-Eun Byun, et al.
Nature|February 4, 2021
Reply to: On the measured dielectric constant of amorphous boron nitrideSeokmo Hong, Min-Hyun Lee, Sang Won Kim, et al.
Nature|June 26, 2020
Ultralow-dielectric-constant amorphous boron nitrideSeokmo Hong, Chang-Seok Lee, Min-Hyun Lee, et al.
Nature|November 26, 2025
Ferroelectric transistors for low-power NAND flash memorySijung Yoo, Taek Jung Kim, Seung-Geol Nam, et al.
Pageof 2

Showing results (11-20 of 19) with videos related to

Sort By:
Pageof 2
You have reached the last page of results.This site can display upto 19 results.
Nano Letters|October 10, 2025
Nanoscale Dynamics of Buried Charge Trap in Oxide-Nitride-Oxide Stacks Investigated Using Kelvin Probe Force MicroscopySungmin Yoon, Seokhoon Choi, Min-Hyun Lee, et al.
ACS Applied Materials & Interfaces|April 4, 2025
Analysis of the Ambipolar Conduction of Tin Monoxide Thin-Film Transistors with Indium Tin Oxide ElectrodesSahngik A Mun, Seoryong Park, Min-Hyun Lee, et al.
Scientific Reports|February 11, 2016
Thickness scaling of atomic-layer-deposited HfO2 films and their application to wafer-scale graphene tunnelling transistorsSeong-Jun Jeong, Yeahyun Gu, Jinseong Heo, et al.
Scientific Reports|December 16, 2014
A low-noise solid-state nanopore platform based on a highly insulating substrateMin-Hyun Lee, Ashvani Kumar, Kyeong-Beom Park, et al.
Advanced Materials (Deerfield Beach, Fla.)|September 16, 2020
High-Throughput Growth of Wafer-Scale Monolayer Transition Metal Dichalcogenide via Vertical Ostwald RipeningMinsu Seol, Min-Hyun Lee, Haeryong Kim, et al.
Nano Letters|July 24, 2018
Two-Dimensional Materials Inserted at the Metal/Semiconductor Interface: Attractive Candidates for Semiconductor Device ContactsMin-Hyun Lee, Yeonchoo Cho, Kyung-Eun Byun, et al.
Nature|February 4, 2021
Reply to: On the measured dielectric constant of amorphous boron nitrideSeokmo Hong, Min-Hyun Lee, Sang Won Kim, et al.
Nature|June 26, 2020
Ultralow-dielectric-constant amorphous boron nitrideSeokmo Hong, Chang-Seok Lee, Min-Hyun Lee, et al.
Nature|November 26, 2025
Ferroelectric transistors for low-power NAND flash memorySijung Yoo, Taek Jung Kim, Seung-Geol Nam, et al.
Pageof 2