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Miroslav Valtr

Showing results (1-10 of 7) with videos related to

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Scientific Reports|September 18, 2020
How levelling and scan line corrections ruin roughness measurement and how to prevent itDavid Nečas, Miroslav Valtr, Petr Klapetek
Nanoscale Research Letters|May 17, 2012
Non-equidistant scanning approach for millimetre-sized SPM measurementsPetr Klapetek, Miroslav Valtr, Petr Buršík
Nanoscale Research Letters|June 23, 2012
Voice coil-based scanning probe microscopyPetr Klapetek, Miroslav Valtr, Václav Ducho 328, et al.
Ultramicroscopy|December 11, 2007
Near-field scanning optical microscope probe analysisPetr Klapetek, Jirí Bursík, Miroslav Valtr, et al.
Nanoscale Research Letters|September 1, 2011
Atomic force microscopy analysis of nanoparticles in non-ideal conditionsPetr Klapetek, Miroslav Valtr, David Nečas, et al.
Hardwarex|July 27, 2023
Scanning Probe Microscopy controller with advanced sampling supportMiroslav Valtr, Petr Klapetek, Jan Martinek, et al.
Sensors (Basel, Switzerland)|January 24, 2014
Short-range six-axis interferometer controlled positioning for scanning probe microscopyJosef Lazar, Petr Klapetek, Miroslav Valtr, et al.
Pageof 1

Showing results (1-10 of 7) with videos related to

Sort By:
Pageof 1
Scientific Reports|September 18, 2020
How levelling and scan line corrections ruin roughness measurement and how to prevent itDavid Nečas, Miroslav Valtr, Petr Klapetek
Nanoscale Research Letters|May 17, 2012
Non-equidistant scanning approach for millimetre-sized SPM measurementsPetr Klapetek, Miroslav Valtr, Petr Buršík
Nanoscale Research Letters|June 23, 2012
Voice coil-based scanning probe microscopyPetr Klapetek, Miroslav Valtr, Václav Ducho 328, et al.
Ultramicroscopy|December 11, 2007
Near-field scanning optical microscope probe analysisPetr Klapetek, Jirí Bursík, Miroslav Valtr, et al.
Nanoscale Research Letters|September 1, 2011
Atomic force microscopy analysis of nanoparticles in non-ideal conditionsPetr Klapetek, Miroslav Valtr, David Nečas, et al.
Hardwarex|July 27, 2023
Scanning Probe Microscopy controller with advanced sampling supportMiroslav Valtr, Petr Klapetek, Jan Martinek, et al.
Sensors (Basel, Switzerland)|January 24, 2014
Short-range six-axis interferometer controlled positioning for scanning probe microscopyJosef Lazar, Petr Klapetek, Miroslav Valtr, et al.
Pageof 1