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Moisés Cywiak

Showing results (1-10 of 13) with videos related to

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Optics Express|March 4, 2011
Diffractive and geometric optical systems characterization with the Fresnel Gaussian shape invariantMoisés Cywiak, Manuel Servín, Arquímedes Morales
Applied Optics|September 14, 2023
Theoretical and experimental study of optical diffractometry based on Fresnel diffraction from a transmission phase stepLuis M González, Moisés Cywiak, David Cywiak
Applied Optics|January 12, 2010
Overall characterization of assembled optical storage devices with a heterodyne microscope: a qualitative comparison with a confocal microscopeJ Mauricio Flores, Moisés Cywiak, Fernando Mendoza
Applied Optics|May 24, 2018
Gaussian probe beam with high spherical aberration for glucose concentration measurementEtna Yáñez, Moisés Cywiak, S Juan Manuel Franco
Applied Optics|September 23, 2008
Inspection of commercial optical devices for data storage using a three Gaussian beam microscope interferometerJ Mauricio Flores, Moisés Cywiak, Manuel Servín, et al.
Optics Express|October 15, 2011
X-ray optics simulation using Gaussian superposition techniqueMourad Idir, Moisés Cywiak, Arquímedes Morales, et al.
Optics Express|October 14, 2010
A technique for calculating the amplitude distribution of propagated fields by Gaussian samplingMoisés Cywiak, Arquímedes Morales, Manuel Servín, et al.
Optics Express|June 25, 2009
Fresnel-Gaussian shape invariant for optical ray tracingMoisés Cywiak, A Morales, J Mauricio Flores, et al.
Applied Optics|November 18, 2014
Refractive index and geometrical thickness measurement of thin optical samples by a transmitted Gaussian beamOctavio Olvera-R, Moisés Cywiak, Joel Cervantes-L, et al.
Optics Express|June 18, 2009
Three Gaussian beam interferometric profilometer applied to the characterization of an optical flatLorenzo Juárez P, Moisés Cywiak, Manuel Servín, et al.
Pageof 2

Showing results (1-10 of 13) with videos related to

Sort By:
Pageof 2
Optics Express|March 4, 2011
Diffractive and geometric optical systems characterization with the Fresnel Gaussian shape invariantMoisés Cywiak, Manuel Servín, Arquímedes Morales
Applied Optics|September 14, 2023
Theoretical and experimental study of optical diffractometry based on Fresnel diffraction from a transmission phase stepLuis M González, Moisés Cywiak, David Cywiak
Applied Optics|January 12, 2010
Overall characterization of assembled optical storage devices with a heterodyne microscope: a qualitative comparison with a confocal microscopeJ Mauricio Flores, Moisés Cywiak, Fernando Mendoza
Applied Optics|May 24, 2018
Gaussian probe beam with high spherical aberration for glucose concentration measurementEtna Yáñez, Moisés Cywiak, S Juan Manuel Franco
Applied Optics|September 23, 2008
Inspection of commercial optical devices for data storage using a three Gaussian beam microscope interferometerJ Mauricio Flores, Moisés Cywiak, Manuel Servín, et al.
Optics Express|October 15, 2011
X-ray optics simulation using Gaussian superposition techniqueMourad Idir, Moisés Cywiak, Arquímedes Morales, et al.
Optics Express|October 14, 2010
A technique for calculating the amplitude distribution of propagated fields by Gaussian samplingMoisés Cywiak, Arquímedes Morales, Manuel Servín, et al.
Optics Express|June 25, 2009
Fresnel-Gaussian shape invariant for optical ray tracingMoisés Cywiak, A Morales, J Mauricio Flores, et al.
Applied Optics|November 18, 2014
Refractive index and geometrical thickness measurement of thin optical samples by a transmitted Gaussian beamOctavio Olvera-R, Moisés Cywiak, Joel Cervantes-L, et al.
Optics Express|June 18, 2009
Three Gaussian beam interferometric profilometer applied to the characterization of an optical flatLorenzo Juárez P, Moisés Cywiak, Manuel Servín, et al.
Pageof 2