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The Review of Scientific Instruments|February 2, 2015
Note: A stand on the basis of atomic force microscope to study substrates for imaging opticsN I Chkhalo, N N Salashchenko, M V ZorinaOptics Express|June 16, 2015
Resolving capacity of the circular Zernike polynomialsM V Svechnikov, N I Chkhalo, M N Toropov, et al.The Review of Scientific Instruments|April 2, 2008
A source of a reference spherical wave based on a single mode optical fiber with a narrowed exit apertureN I Chkhalo, A Yu Klimov, V V Rogov, et al.Optics Letters|February 13, 2026
Highly reflective Cr/C-based multilayer X-ray mirrors for the wavelength λ = 4.47 nmR A Shaposhnikov, V N Polkovnikov, S A Garaknin, et al.Optics Letters|February 14, 2015
Application of point diffraction interferometry for middle spatial frequency roughness detectionM V Svechnikov, N I Chkhalo, M N Toropov, et al.Optics Letters|August 15, 2024
Al/Zr-based multilayer mirrors with record-breaking reflectivityV N Polkovnikov, N I Chkhalo, S A Garakhin, et al.Optics Letters|September 1, 2022
Highly reflective Ru/Sr multilayer mirrors for wavelengths 9-12 nmR A Shaposhnikov, V N Polkovnikov, N N Salashchenko, et al.Optics Express|October 17, 2014
Roughness measurement and ion-beam polishing of super-smooth optical surfaces of fused quartz and optical ceramicsN I Chkhalo, S A Churin, A E Pestov, et al.The Review of Scientific Instruments|July 3, 2015
Sub-micrometer resolution proximity X-ray microscope with digital image registrationN I Chkhalo, A E Pestov, N N Salashchenko, et al.Journal of X-Ray Science and Technology|February 11, 2011
Study of the inner structure of co/c and ni/c multilayers prepared by pulsed laser evaporation methodV A Chernov, N I Chkhalo, M V Fedorchenko, et al.Pageof 4