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The Review of Scientific Instruments
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February 2, 2015
Note: A stand on the basis of atomic force microscope to study substrates for imaging optics
N I Chkhalo, N N Salashchenko, M V Zorina
Optics Express
|
June 16, 2015
Resolving capacity of the circular Zernike polynomials
M V Svechnikov, N I Chkhalo, M N Toropov, et al.
The Review of Scientific Instruments
|
April 2, 2008
A source of a reference spherical wave based on a single mode optical fiber with a narrowed exit aperture
N I Chkhalo, A Yu Klimov, V V Rogov, et al.
Optics Letters
|
February 13, 2026
Highly reflective Cr/C-based multilayer X-ray mirrors for the wavelength λ = 4.47 nm
R A Shaposhnikov, V N Polkovnikov, S A Garaknin, et al.
Optics Letters
|
February 14, 2015
Application of point diffraction interferometry for middle spatial frequency roughness detection
M V Svechnikov, N I Chkhalo, M N Toropov, et al.
Optics Letters
|
August 15, 2024
Al/Zr-based multilayer mirrors with record-breaking reflectivity
V N Polkovnikov, N I Chkhalo, S A Garakhin, et al.
Optics Letters
|
September 1, 2022
Highly reflective Ru/Sr multilayer mirrors for wavelengths 9-12 nm
R A Shaposhnikov, V N Polkovnikov, N N Salashchenko, et al.
Optics Express
|
October 17, 2014
Roughness measurement and ion-beam polishing of super-smooth optical surfaces of fused quartz and optical ceramics
N I Chkhalo, S A Churin, A E Pestov, et al.
The Review of Scientific Instruments
|
July 3, 2015
Sub-micrometer resolution proximity X-ray microscope with digital image registration
N I Chkhalo, A E Pestov, N N Salashchenko, et al.
Journal of X-Ray Science and Technology
|
February 11, 2011
Study of the inner structure of co/c and ni/c multilayers prepared by pulsed laser evaporation method
V A Chernov, N I Chkhalo, M V Fedorchenko, et al.
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of 4
Search research articles
Search
Showing results (1-10 of 31) with videos related to
Sort By:
Page
of 4
The Review of Scientific Instruments
|
February 2, 2015
Note: A stand on the basis of atomic force microscope to study substrates for imaging optics
N I Chkhalo, N N Salashchenko, M V Zorina
Optics Express
|
June 16, 2015
Resolving capacity of the circular Zernike polynomials
M V Svechnikov, N I Chkhalo, M N Toropov, et al.
The Review of Scientific Instruments
|
April 2, 2008
A source of a reference spherical wave based on a single mode optical fiber with a narrowed exit aperture
N I Chkhalo, A Yu Klimov, V V Rogov, et al.
Optics Letters
|
February 13, 2026
Highly reflective Cr/C-based multilayer X-ray mirrors for the wavelength λ = 4.47 nm
R A Shaposhnikov, V N Polkovnikov, S A Garaknin, et al.
Optics Letters
|
February 14, 2015
Application of point diffraction interferometry for middle spatial frequency roughness detection
M V Svechnikov, N I Chkhalo, M N Toropov, et al.
Optics Letters
|
August 15, 2024
Al/Zr-based multilayer mirrors with record-breaking reflectivity
V N Polkovnikov, N I Chkhalo, S A Garakhin, et al.
Optics Letters
|
September 1, 2022
Highly reflective Ru/Sr multilayer mirrors for wavelengths 9-12 nm
R A Shaposhnikov, V N Polkovnikov, N N Salashchenko, et al.
Optics Express
|
October 17, 2014
Roughness measurement and ion-beam polishing of super-smooth optical surfaces of fused quartz and optical ceramics
N I Chkhalo, S A Churin, A E Pestov, et al.
The Review of Scientific Instruments
|
July 3, 2015
Sub-micrometer resolution proximity X-ray microscope with digital image registration
N I Chkhalo, A E Pestov, N N Salashchenko, et al.
Journal of X-Ray Science and Technology
|
February 11, 2011
Study of the inner structure of co/c and ni/c multilayers prepared by pulsed laser evaporation method
V A Chernov, N I Chkhalo, M V Fedorchenko, et al.
Page
of 4