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N N Sedov

Showing results (1-10 of 4) with videos related to

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Journal of Microscopy|September 14, 2001
Peculiarities of imaging one- and two-dimensional structures using an electron microscope in the mirror operation modeS A Nepijko, N N Sedov, G Schönhense
Journal of Microscopy|July 4, 2003
Measurement of the electric field distribution and potentials on the object surface in an emission electron microscope without restriction of the electron beamsS A Nepijko, A Gloskovskii, N N Sedov, et al.
Journal of Microscopy|May 10, 2002
Use of emission electron microscope for potential mapping in semiconductor microelectronicsS A Nepijko, N N Sedov, G Schönhense, et al.
Journal of Microscopy|June 26, 2001
Imaging of three-dimensional objects in emission electron microscopyS A Nepijko, N N Sedov, O Schmidt, et al.
Pageof 1

Showing results (1-10 of 4) with videos related to

Sort By:
Pageof 1
Journal of Microscopy|September 14, 2001
Peculiarities of imaging one- and two-dimensional structures using an electron microscope in the mirror operation modeS A Nepijko, N N Sedov, G Schönhense
Journal of Microscopy|July 4, 2003
Measurement of the electric field distribution and potentials on the object surface in an emission electron microscope without restriction of the electron beamsS A Nepijko, A Gloskovskii, N N Sedov, et al.
Journal of Microscopy|May 10, 2002
Use of emission electron microscope for potential mapping in semiconductor microelectronicsS A Nepijko, N N Sedov, G Schönhense, et al.
Journal of Microscopy|June 26, 2001
Imaging of three-dimensional objects in emission electron microscopyS A Nepijko, N N Sedov, O Schmidt, et al.
Pageof 1