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Ultramicroscopy|March 31, 2015
An analytical model accounting for tip shape evolution during atom probe analysis of heterogeneous materialsN Rolland, D J Larson, B P Geiser, et al.Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 6, 2004
Modeling image distortions in 3DAPF Vurpillot, A Cerezo, D Blavette, et al.Ultramicroscopy|January 5, 2002
A new approach to the interpretation of atom probe field-ion microscopy imagesF Vurpillot, A Bostel, D BlavetteUltramicroscopy|January 22, 2003
A new step towards the lattice reconstruction in 3DAPF Vurpillot, L Renaud, D BlavetteUltramicroscopy|April 10, 2010
Clustering and pair correlation function in atom probe tomographyT Philippe, S Duguay, D BlavetteUltramicroscopy|January 5, 2002
A model accounting for spatial overlaps in 3D atom-probe microscopyD Blavette, F Vurpillot, P Pareige, et al.Journal of Microscopy|September 14, 2001
Structural analyses in three-dimensional atom probe: a Fourier transform approachF Vurpillot, G Da Costa, A Menand, et al.Ultramicroscopy|December 15, 2012
Point process statistics in atom probe tomographyT Philippe, S Duguay, G Grancher, et al.Journal of Microscopy|June 29, 2010
Clustering and nearest neighbour distances in atom probe tomography: the influence of the interfacesT Philippe, O Cojocaru-Mirédin, S Duguay, et al.Journal of Microscopy|November 30, 2004
Application of Fourier transform and autocorrelation to cluster identification in the three-dimensional atom probeF Vurpillot, F De Geuser, G Da Costa, et al.Pageof 10