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Naoya Shibata

Showing results (11-20 of 174) with videos related to

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Microscopy (Oxford, England)|April 18, 2024
Diffraction contrast of ferroelectric domains in DPC STEM imagesMasaya Takamoto, Takehito Seki, Yuichi Ikuhara, et al.
Small Methods|May 18, 2026
Enhancing Dose Efficiency of Optimum Bright-Field Scanning Transmission Electron Microscopy Using a Phase-Shifted Electron ProbeMitsuru Nogami, Takehito Seki, Kousuke Ooe, et al.
Journal of Electron Microscopy|June 12, 2010
Prospects for 3D imaging of dopant atoms in ceramic interfacesScott D Findlay, Naoya Shibata, Shinya Azuma, et al.
Nature Communications|October 18, 2024
Direct observation of space-charge-induced electric fields at oxide grain boundariesSatoko Toyama, Takehito Seki, Bin Feng, et al.
Microscopy (Oxford, England)|December 29, 2023
Magnetic field observation in a magnetic tunnel junction by scanning transmission electron microscopyYuji Kohno, Takehito Seki, Shun Tsuruoka, et al.
Microscopy (Oxford, England)|September 12, 2022
Spatial and phase resolution in electron microscopyRyo Ishikawa, Shigeyuki Morishita, Toshiaki Tanigaki, et al.
Microscopy (Oxford, England)|October 10, 2017
Boundary-artifact-free determination of potential distribution from differential phase contrast signalsAkimitsu Ishizuka, Masaaki Oka, Takehito Seki, et al.
Journal of the American Chemical Society|July 11, 2015
Fabrication of a Core-Shell-Type Photocatalyst via Photodeposition of Group IV and V Transition Metal Oxyhydroxides: An Effective Surface Modification Method for Overall Water SplittingTsuyoshi Takata, Chengsi Pan, Mamiko Nakabayashi, et al.
Nature Communications|March 19, 2022
Direct imaging of the disconnection climb mediated point defects absorption by a grain boundaryJiake Wei, Bin Feng, Eita Tochigi, et al.
Microscopy (Oxford, England)|April 1, 2015
Resolving 45-pm-separated Si-Si atomic columns with an aberration-corrected STEMHidetaka Sawada, Naoki Shimura, Fumio Hosokawa, et al.
Pageof 18

Showing results (11-20 of 174) with videos related to

Sort By:
Pageof 18
Microscopy (Oxford, England)|April 18, 2024
Diffraction contrast of ferroelectric domains in DPC STEM imagesMasaya Takamoto, Takehito Seki, Yuichi Ikuhara, et al.
Small Methods|May 18, 2026
Enhancing Dose Efficiency of Optimum Bright-Field Scanning Transmission Electron Microscopy Using a Phase-Shifted Electron ProbeMitsuru Nogami, Takehito Seki, Kousuke Ooe, et al.
Journal of Electron Microscopy|June 12, 2010
Prospects for 3D imaging of dopant atoms in ceramic interfacesScott D Findlay, Naoya Shibata, Shinya Azuma, et al.
Nature Communications|October 18, 2024
Direct observation of space-charge-induced electric fields at oxide grain boundariesSatoko Toyama, Takehito Seki, Bin Feng, et al.
Microscopy (Oxford, England)|December 29, 2023
Magnetic field observation in a magnetic tunnel junction by scanning transmission electron microscopyYuji Kohno, Takehito Seki, Shun Tsuruoka, et al.
Microscopy (Oxford, England)|September 12, 2022
Spatial and phase resolution in electron microscopyRyo Ishikawa, Shigeyuki Morishita, Toshiaki Tanigaki, et al.
Microscopy (Oxford, England)|October 10, 2017
Boundary-artifact-free determination of potential distribution from differential phase contrast signalsAkimitsu Ishizuka, Masaaki Oka, Takehito Seki, et al.
Journal of the American Chemical Society|July 11, 2015
Fabrication of a Core-Shell-Type Photocatalyst via Photodeposition of Group IV and V Transition Metal Oxyhydroxides: An Effective Surface Modification Method for Overall Water SplittingTsuyoshi Takata, Chengsi Pan, Mamiko Nakabayashi, et al.
Nature Communications|March 19, 2022
Direct imaging of the disconnection climb mediated point defects absorption by a grain boundaryJiake Wei, Bin Feng, Eita Tochigi, et al.
Microscopy (Oxford, England)|April 1, 2015
Resolving 45-pm-separated Si-Si atomic columns with an aberration-corrected STEMHidetaka Sawada, Naoki Shimura, Fumio Hosokawa, et al.
Pageof 18