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Ndubuisi G Orji

Showing results (1-10 of 5) with videos related to

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Journal of Micro/Nanolithography, MEMS, and MOEMS : JM3|November 1, 2024
Multiple-Instrument Evaluation of the Consistency and Long Term Stability of Tip Width Calibration for Critical Dimension Atomic Force MicroscopyRonald G Dixson, Ndubuisi G Orji
Journal of Micro/Nanolithography, MEMS, and MOEMS : JM3|April 19, 2016
Lateral Tip Control Effects in CD-AFM Metrology: The Large Tip LimitRonald G Dixson, Ndubuisi G Orji, Ryan S Goldband
Journal of Micro/Nanolithography, MEMS, and MOEMS : JM3|December 11, 2020
Wear comparison of critical dimension-atomic force microscopy tipsNdubuisi G Orji, Ronald G Dixson, Ernesto Lopez, et al.
Ultramicroscopy|January 1, 2016
Tip characterization method using multi-feature characterizer for CD-AFMNdubuisi G Orji, Hiroshi Itoh, Chumei Wang, et al.
Journal of Micro/Nanolithography, MEMS, and MOEMS : JM3|November 15, 2016
Evaluation of carbon nanotube probes in critical dimension atomic force microscopesJinho Choi, Byong Chon Park, Sang Jung Ahn, et al.
Pageof 1

Showing results (1-10 of 5) with videos related to

Sort By:
Pageof 1
Journal of Micro/Nanolithography, MEMS, and MOEMS : JM3|November 1, 2024
Multiple-Instrument Evaluation of the Consistency and Long Term Stability of Tip Width Calibration for Critical Dimension Atomic Force MicroscopyRonald G Dixson, Ndubuisi G Orji
Journal of Micro/Nanolithography, MEMS, and MOEMS : JM3|April 19, 2016
Lateral Tip Control Effects in CD-AFM Metrology: The Large Tip LimitRonald G Dixson, Ndubuisi G Orji, Ryan S Goldband
Journal of Micro/Nanolithography, MEMS, and MOEMS : JM3|December 11, 2020
Wear comparison of critical dimension-atomic force microscopy tipsNdubuisi G Orji, Ronald G Dixson, Ernesto Lopez, et al.
Ultramicroscopy|January 1, 2016
Tip characterization method using multi-feature characterizer for CD-AFMNdubuisi G Orji, Hiroshi Itoh, Chumei Wang, et al.
Journal of Micro/Nanolithography, MEMS, and MOEMS : JM3|November 15, 2016
Evaluation of carbon nanotube probes in critical dimension atomic force microscopesJinho Choi, Byong Chon Park, Sang Jung Ahn, et al.
Pageof 1