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Nicholas W M Ritchie

Showing results (21-30 of 27) with videos related to

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 11, 2023
Quantification of Unsupported Thin-Film X-ray Spectra Using Bulk StandardsNicholas W M Ritchie, Andrew Herzing, Vladimir P Oleshko
Environmental Science. Processes & Impacts|September 12, 2014
Use of force-sensing array films to improve surface wipe samplingJennifer R Verkouteren, Nicholas W M Ritchie, Greg Gillen
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 10, 2011
Compton scattering artifacts in electron excited X-ray spectra measured with a silicon drift detectorNicholas W M Ritchie, Dale E Newbury, Abigail P Lindstrom
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 1, 2012
EDS measurements of X-ray intensity at WDS precision and accuracy using a silicon drift detectorNicholas W M Ritchie, Dale E Newbury, Jeffrey M Davis
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 17, 2023
Registering Particle Data Sets Using a Rotation and Translation Invariant Nearest-Neighbor AlgorithmNicholas W M Ritchie, Scott Wight, Diana Ortiz-Montalvo, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 24, 2011
Bridging the micro-to-macro gap: a new application for micro X-ray fluorescenceJeffrey M Davis, Dale E Newbury, Albert Fahey, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 25, 2009
Characterization of SiGe films for use as a National Institute of Standards and Technology Microanalysis Reference Material (RM 8905)Ryna B Marinenko, Shirley Turner, David S Simons, et al.
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Showing results (21-30 of 27) with videos related to

Sort By:
Pageof 3
You have reached the last page of results.This site can display upto 27 results.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 11, 2023
Quantification of Unsupported Thin-Film X-ray Spectra Using Bulk StandardsNicholas W M Ritchie, Andrew Herzing, Vladimir P Oleshko
Environmental Science. Processes & Impacts|September 12, 2014
Use of force-sensing array films to improve surface wipe samplingJennifer R Verkouteren, Nicholas W M Ritchie, Greg Gillen
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 10, 2011
Compton scattering artifacts in electron excited X-ray spectra measured with a silicon drift detectorNicholas W M Ritchie, Dale E Newbury, Abigail P Lindstrom
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 1, 2012
EDS measurements of X-ray intensity at WDS precision and accuracy using a silicon drift detectorNicholas W M Ritchie, Dale E Newbury, Jeffrey M Davis
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 17, 2023
Registering Particle Data Sets Using a Rotation and Translation Invariant Nearest-Neighbor AlgorithmNicholas W M Ritchie, Scott Wight, Diana Ortiz-Montalvo, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 24, 2011
Bridging the micro-to-macro gap: a new application for micro X-ray fluorescenceJeffrey M Davis, Dale E Newbury, Albert Fahey, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 25, 2009
Characterization of SiGe films for use as a National Institute of Standards and Technology Microanalysis Reference Material (RM 8905)Ryna B Marinenko, Shirley Turner, David S Simons, et al.
Pageof 3