Bridging the micro-to-macro gap: a new application for micro X-ray fluorescence

Jeffrey M Davis1, Dale E Newbury, Albert Fahey

  • 1Microanalysis Research Group, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, MD 20899-8371, USA. jeff.davis@nist.gov

Summary

Micro X-ray fluorescence-X-ray spectrum imaging (μXRF-XSI) enables large-area elemental mapping of heterogeneous materials, overcoming spatial limitations of traditional microbeam methods. This X-ray excitation technique offers enhanced sensitivity and atmospheric analysis for macro-scale investigations.

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