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Updated: Jun 1, 2026

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
Published on: June 19, 2018
Bridging the micro-to-macro gap: a new application for micro X-ray fluorescence
Jeffrey M Davis1, Dale E Newbury, Albert Fahey
1Microanalysis Research Group, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, MD 20899-8371, USA. jeff.davis@nist.gov
Micro X-ray fluorescence-X-ray spectrum imaging (μXRF-XSI) enables large-area elemental mapping of heterogeneous materials, overcoming spatial limitations of traditional microbeam methods. This X-ray excitation technique offers enhanced sensitivity and atmospheric analysis for macro-scale investigations.
Area of Science:
- Materials Science
- Analytical Chemistry
- Geochemistry
Background:
- X-ray elemental mapping and X-ray spectrum imaging are valuable microanalytical techniques.
- Spatial limitations of scanning electron microscopes and microprobes restrict analysis to small sample areas.
- Analyzing large, heterogeneous materials like concrete requires methods capable of macro-scale examination.
Purpose of the Study:
- To address the limitations of microbeam analysis for large-area elemental mapping.
- To introduce and evaluate Micro X-ray fluorescence-X-ray spectrum imaging (μXRF-XSI) as a solution for macro-scale analysis.
- To demonstrate the advantages of μXRF-XSI over electron-excitation sources for heterogeneous materials.
Main Methods:
- Utilized Micro X-ray fluorescence-X-ray spectrum imaging (μXRF-XSI) with an X-ray excitation source.
- Employed a mid-sized beam for analysis, enabling operation at atmospheric pressure.
- Compared μXRF-XSI capabilities with traditional electron microbeam methods.
Main Results:
- μXRF-XSI overcomes the spatial limitations of electron microprobes for analyzing large specimens (>10 cm²).
- The technique allows for macro-scale imaging of heterogeneous materials, revealing structures and concentration gradients.
- μXRF-XSI offers lower limits of detection due to the absence of electron-induced bremsstrahlung and can complement electron microbeam analysis.
Conclusions:
- μXRF-XSI is a powerful tool for the macro-scale elemental analysis of large and heterogeneous samples.
- This method provides a viable alternative to microbeam techniques when large area coverage is required.
- μXRF-XSI enhances analytical capabilities by complementing finer-scale microanalysis and offering improved detection limits.
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