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Ultramicroscopy|April 22, 2022
Learning Atom Probe Tomography time-of-flight peaks for mass-to-charge ratio spectrometryKevin J Coakley, Norman A Sanford
Journal of Electronic Materials|September 21, 2023
Comparative Apex Electrostatics of Atom Probe Tomography SpecimensQihua Zhang, Benjamin Klein, Norman A Sanford, et al.
The Review of Scientific Instruments|September 13, 2023
Atom probe tomography using an extreme ultraviolet trigger pulseBenjamin W Caplins, Ann N Chiaramonti, Jacob M Garcia, et al.
Optics Letters|December 19, 2003
Passively mode-locked glass waveguide laser with 14-fs timing jitterJohn B Schlager, Berton E Callicoatt, Richard P Mirin, et al.
Ultramicroscopy|May 15, 2020
An algorithm for correcting systematic energy deficits in the atom probe mass spectra of insulating samplesBenjamin W Caplins, Paul T Blanchard, Ann N Chiaramonti, et al.
Nanotechnology|August 23, 2012
Microstructure evolution and development of annealed Ni/Au contacts to GaN nanowiresAndrew M Herrero, Paul T Blanchard, Aric Sanders, et al.
Nano Letters|August 29, 2012
Noncontact measurement of charge carrier lifetime and mobility in GaN nanowiresPatrick Parkinson, Christopher Dodson, Hannah J Joyce, et al.
Nanotechnology|June 16, 2011
Highly selective GaN-nanowire/TiO2-nanocluster hybrid sensors for detection of benzene and related environment pollutantsGeetha S Aluri, Abhishek Motayed, Albert V Davydov, et al.
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