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Nano Letters|December 6, 2019
Investigating Bond Rupture in Resonantly Bonded Solids by Field Evaporation of Carbon NanotubesMohit Raghuwanshi, Oana Cojocaru-Mirédin, Matthias Wuttig
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 7, 2020
Solving Peak Overlaps for Proximity Histogram Analysis of Complex Interfaces for Atom Probe Tomography DataJens Keutgen, Andrew J London, Oana Cojocaru-Mirédin
Romanian Journal of Morphology and Embryology = Revue Roumaine De Morphologie Et Embryologie|January 9, 2016
Laryngeal primary malignant melanoma: a case reportOana Cojocaru, Mariana Aşchie, Liliana Mocanu, et al.
MRS Bulletin|March 9, 2026
Structure and composition of grain boundaries and their impact on functional properties of energy materialsOana Cojocaru-Mirédin, Elisa Wade, Yuan Yu, et al.
ACS Applied Materials & Interfaces|April 11, 2018
Evidence of Enhanced Carrier Collection in Cu(In,Ga)Se2 Grain Boundaries: Correlation with MicrostructureMohit Raghuwanshi, Bo Thöner, Purvesh Soni, et al.
Nature Communications|February 9, 2023
Strong charge carrier scattering at grain boundaries of PbTe caused by the collapse of metavalent bondingRiga Wu, Yuan Yu, Shuo Jia, et al.
Journal of Visualized Experiments : Jove|May 1, 2013
Atom probe tomography studies on the Cu(In,ga)Se2 grain boundariesOana Cojocaru-Mirédin, Torsten Schwarz, Pyuck-Pa Choi, et al.
Journal of Physics. Condensed Matter : an Institute of Physics Journal|February 16, 2019
Role of grain boundaries in Ge-Sb-Te based chalcogenide superlatticesOana Cojocaru-Mirédin, Henning Hollermann, Antonio M Mio, et al.
ACS Nano|February 6, 2025
Thermally Assisted Atomic-Scale Intermixing and Ordering in GeTe-Sb2Te3 SuperlatticesOana Cojocaru-Mirédin, Jasmin-Clara Bürger, Nikita Polin, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 21, 2017
Correlating Atom Probe Tomography with Atomic-Resolved Scanning Transmission Electron Microscopy: Example of Segregation at Silicon Grain BoundariesAndreas Stoffers, Juri Barthel, Christian H Liebscher, et al.
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