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Oliver Oppermann

Showing results (1-10 of 4) with videos related to

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Ultramicroscopy|May 8, 2022
Angle-dependence of ADF-STEM intensities for chemical analysis of InGaN/GaNTim Grieb, Florian F Krause, Knut Müller-Caspary, et al.
Ultramicroscopy|December 31, 2020
Angle-resolved STEM using an iris aperture: Scattering contributions and sources of error for the quantitative analysis in SiTim Grieb, Florian F Krause, Knut Müller-Caspary, et al.
Scientific Reports|November 17, 2016
Materials characterisation by angle-resolved scanning transmission electron microscopyKnut Müller-Caspary, Oliver Oppermann, Tim Grieb, et al.
Ultramicroscopy|February 15, 2021
Precise measurement of the electron beam current in a TEMFlorian F Krause, Marco Schowalter, Oliver Oppermann, et al.
Pageof 1

Showing results (1-10 of 4) with videos related to

Sort By:
Pageof 1
Ultramicroscopy|May 8, 2022
Angle-dependence of ADF-STEM intensities for chemical analysis of InGaN/GaNTim Grieb, Florian F Krause, Knut Müller-Caspary, et al.
Ultramicroscopy|December 31, 2020
Angle-resolved STEM using an iris aperture: Scattering contributions and sources of error for the quantitative analysis in SiTim Grieb, Florian F Krause, Knut Müller-Caspary, et al.
Scientific Reports|November 17, 2016
Materials characterisation by angle-resolved scanning transmission electron microscopyKnut Müller-Caspary, Oliver Oppermann, Tim Grieb, et al.
Ultramicroscopy|February 15, 2021
Precise measurement of the electron beam current in a TEMFlorian F Krause, Marco Schowalter, Oliver Oppermann, et al.
Pageof 1