Showing results (1-10 of 7) with videos related to

Sort By:
Pageof 1
Nanotechnology|August 7, 2015
Fast Fourier transform scanning spreading resistance microscopy: a novel technique to overcome the limitations of classical conductive AFM techniquesP Eyben, P Bisiaux, A Schulze, et al.
Ultramicroscopy|December 2, 2015
Outwitting the series resistance in scanning spreading resistance microscopyA Schulze, R Cao, P Eyben, et al.
Nanotechnology|July 9, 2009
Evolution of metastable phases in silicon during nanoindentation: mechanism analysis and experimental verificationK Mylvaganam, L C Zhang, P Eyben, et al.
Nanotechnology|July 12, 2012
Electrical tomography using atomic force microscopy and its application towards carbon nanotube-based interconnectsA Schulze, T Hantschel, A Dathe, et al.
Ultramicroscopy|January 1, 2013
Quantitative three-dimensional carrier mapping in nanowire-based transistors using scanning spreading resistance microscopyA Schulze, T Hantschel, P Eyben, et al.
Nanoscale|January 27, 2016
Insights into the nanoscale lateral and vertical phase separation in organic bulk heterojunctions via scanning probe microscopyR Chintala, J G Tait, P Eyben, et al.
Nanotechnology|March 19, 2011
Observation of diameter dependent carrier distribution in nanowire-based transistorsA Schulze, T Hantschel, P Eyben, et al.
Pageof 1