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P Kruit

Showing results (1-10 of 22) with videos related to

Pageof 3
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Ultramicroscopy|January 1, 1985
The influence of objective lens aberrations in energy-loss spectrometryP Kruit, H Shuman
Scanning|June 7, 2005
Shot noise in electron beam lithography and line width measurementsP Kruit, S Steenbrink
Ultramicroscopy|July 8, 2010
'Collapsing rings' on Schottky electron emittersM S Bronsgeest, P Kruit
Ultramicroscopy|November 7, 2020
Flat electron mirrorM A R Krielaart, P Kruit
Ultramicroscopy|December 5, 2021
Principles of electron wave front modulation with two miniature electron mirrorsM A R Krielaart, P Kruit
Tijdschrift Voor Gerontologie En Geriatrie|May 1, 1987
Care of the elderly in the NetherlandsH P Kruit, J R Kruizenga
Ultramicroscopy|July 12, 2011
Simulation of ion imaging: sputtering, contrast, noiseV Castaldo, C W Hagen, P Kruit
Scanning|March 1, 2006
Shot noise in electron-beam lithography and line-width measurementsP Kruit, S W H K Steenbrink
Ultramicroscopy|January 1, 1984
Detection of X-rays and electron energy loss events in time coincidenceP Kruit, H Shuman, A P Somlyo
Scanning|August 11, 2006
Resolution limit for electron beam-induced deposition on thick substratesC W Hagen, N Silvis-Cividjian, P Kruit
Pageof 3

Showing results (1-10 of 22) with videos related to

Sort By:
Pageof 3
Ultramicroscopy|January 1, 1985
The influence of objective lens aberrations in energy-loss spectrometryP Kruit, H Shuman
Scanning|June 7, 2005
Shot noise in electron beam lithography and line width measurementsP Kruit, S Steenbrink
Ultramicroscopy|July 8, 2010
'Collapsing rings' on Schottky electron emittersM S Bronsgeest, P Kruit
Ultramicroscopy|November 7, 2020
Flat electron mirrorM A R Krielaart, P Kruit
Ultramicroscopy|December 5, 2021
Principles of electron wave front modulation with two miniature electron mirrorsM A R Krielaart, P Kruit
Tijdschrift Voor Gerontologie En Geriatrie|May 1, 1987
Care of the elderly in the NetherlandsH P Kruit, J R Kruizenga
Ultramicroscopy|July 12, 2011
Simulation of ion imaging: sputtering, contrast, noiseV Castaldo, C W Hagen, P Kruit
Scanning|March 1, 2006
Shot noise in electron-beam lithography and line-width measurementsP Kruit, S W H K Steenbrink
Ultramicroscopy|January 1, 1984
Detection of X-rays and electron energy loss events in time coincidenceP Kruit, H Shuman, A P Somlyo
Scanning|August 11, 2006
Resolution limit for electron beam-induced deposition on thick substratesC W Hagen, N Silvis-Cividjian, P Kruit
Pageof 3