Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

P M Voyles

Showing results (1-10 of 15) with videos related to

Pageof 2
Sort By:
Ultramicroscopy|September 18, 2012
Analytical and computational modeling of fluctuation electron microscopy from a nanocrystal/amorphous compositeFeng Yi, P M Voyles
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 3, 2010
Variable resolution fluctuation electron microscopy on Cu-Zr metallic glass using a wide range of coherent STEM probe sizeJinwoo Hwang, P M Voyles
Ultramicroscopy|August 26, 2011
Effect of sample thickness, energy filtering, and probe coherence on fluctuation electron microscopy experimentsFeng Yi, P M Voyles
Ultramicroscopy|December 25, 2007
A phenomenological model of fluctuation electron microscopy for a nanocrystal/amorphous compositeW G Stratton, P M Voyles
Ultramicroscopy|August 19, 2006
Prospects for 3D, nanometer-resolution imaging by confocal STEMJ J Einspahr, P M Voyles
Ultramicroscopy|November 12, 2002
Fluctuation microscopy in the STEMP M Voyles, D A Muller
Ultramicroscopy|November 17, 2012
Inelastic and elastic mean free paths from FIB samples of metallic glassesD T Schweiss, Jinwoo Hwang, P M Voyles
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 13, 2004
Depth-dependent imaging of individual dopant atoms in siliconP M Voyles, D A Muller, E J Kirkland
Ultramicroscopy|July 23, 2003
Imaging individual atoms inside crystals with ADF-STEMP M Voyles, J L Grazul, D A Muller
Ultramicroscopy|September 21, 2016
Elastic and inelastic mean free paths of 200keV electrons in metallic glassesPei Zhang, Zhe Wang, J H Perepezko, et al.
Pageof 2

Showing results (1-10 of 15) with videos related to

Sort By:
Pageof 2
Ultramicroscopy|September 18, 2012
Analytical and computational modeling of fluctuation electron microscopy from a nanocrystal/amorphous compositeFeng Yi, P M Voyles
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 3, 2010
Variable resolution fluctuation electron microscopy on Cu-Zr metallic glass using a wide range of coherent STEM probe sizeJinwoo Hwang, P M Voyles
Ultramicroscopy|August 26, 2011
Effect of sample thickness, energy filtering, and probe coherence on fluctuation electron microscopy experimentsFeng Yi, P M Voyles
Ultramicroscopy|December 25, 2007
A phenomenological model of fluctuation electron microscopy for a nanocrystal/amorphous compositeW G Stratton, P M Voyles
Ultramicroscopy|August 19, 2006
Prospects for 3D, nanometer-resolution imaging by confocal STEMJ J Einspahr, P M Voyles
Ultramicroscopy|November 12, 2002
Fluctuation microscopy in the STEMP M Voyles, D A Muller
Ultramicroscopy|November 17, 2012
Inelastic and elastic mean free paths from FIB samples of metallic glassesD T Schweiss, Jinwoo Hwang, P M Voyles
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 13, 2004
Depth-dependent imaging of individual dopant atoms in siliconP M Voyles, D A Muller, E J Kirkland
Ultramicroscopy|July 23, 2003
Imaging individual atoms inside crystals with ADF-STEMP M Voyles, J L Grazul, D A Muller
Ultramicroscopy|September 21, 2016
Elastic and inelastic mean free paths of 200keV electrons in metallic glassesPei Zhang, Zhe Wang, J H Perepezko, et al.
Pageof 2