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Applied Optics|December 4, 2010
Motion-resolved imaging of moving objects embedded within scattering media by the use of time-gated speckle analysisP Naulleau, D DilworthApplied Optics|November 25, 2010
Noise analysis for the holographic first-arriving-light techniqueP Naulleau, D DilworthOptics Letters|November 3, 2009
Ensemble-averaged imaging through highly scattering mediaE Leith, P Naulleau, D DilworthApplied Optics|November 19, 2010
Resolution-enhanced detection of moving objects embedded within scattering media using time-gated speckle methodsP Naulleau, D Dilworth, E Leith, et al.Optics Letters|October 28, 2009
Detection of moving objects embedded within scattering media by use of speckle methodsP Naulleau, D Dilworth, E Leith, et al.Applied Optics|February 12, 2008
Analysis of the confined-reference coherence-encoding method for image transmission through optical fibersP NaulleauApplied Optics|June 23, 2009
Correlation method for the measure of mask-induced line-edge roughness in extreme ultraviolet lithographyPatrick P NaulleauApplied Optics|February 13, 2004
Verification of point-spread-function-based modeling of an extreme-ultraviolet photoresistPatrick P NaulleauApplied Optics|February 1, 2005
Effect of mask-roughness on printed contact-size variation in extreme-ultraviolet lithographyPatrick P NaulleauApplied Optics|August 3, 2004
Relevance of mask-roughness-induced printed line-edge roughness in recent and future extreme-ultraviolet lithography testsPatrick P NaulleauPageof 6