Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

P R Munroe

Showing results (1-10 of 6) with videos related to

Pageof 1
Sort By:
Journal of Microscopy|May 26, 2004
FIB-induced damage in siliconS Rubanov, P R Munroe
Micron (Oxford, England : 1993)|June 29, 2004
The application of FIB milling for specimen preparation from crystalline germaniumS Rubanov, P R Munroe
Microscopy Research and Technique|February 7, 2007
Imaging and analysis of 3-D structure using a dual beam FIBD McGrouther, P R Munroe
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 8, 2007
Damage in III-V compounds during focused ion beam millingS Rubanov, P R Munroe
Micron (Oxford, England : 1993)|June 13, 2003
Redeposition effects in transmission electron microscope specimens of FeAl-WC composites prepared using a focused ion beamJ M Cairney, P R Munroe
Journal of Microscopy|February 24, 2001
Microstructural analysis of a FeAl/quasicrystal-based composite prepared using a focused ion beam millerJ. M. Cairney, P. R. Munroe, D. J. Sordelet
Pageof 1

Showing results (1-10 of 6) with videos related to

Sort By:
Pageof 1
Journal of Microscopy|May 26, 2004
FIB-induced damage in siliconS Rubanov, P R Munroe
Micron (Oxford, England : 1993)|June 29, 2004
The application of FIB milling for specimen preparation from crystalline germaniumS Rubanov, P R Munroe
Microscopy Research and Technique|February 7, 2007
Imaging and analysis of 3-D structure using a dual beam FIBD McGrouther, P R Munroe
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 8, 2007
Damage in III-V compounds during focused ion beam millingS Rubanov, P R Munroe
Micron (Oxford, England : 1993)|June 13, 2003
Redeposition effects in transmission electron microscope specimens of FeAl-WC composites prepared using a focused ion beamJ M Cairney, P R Munroe
Journal of Microscopy|February 24, 2001
Microstructural analysis of a FeAl/quasicrystal-based composite prepared using a focused ion beam millerJ. M. Cairney, P. R. Munroe, D. J. Sordelet
Pageof 1