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P V Ashrit

Showing results (1-10 of 8) with videos related to

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Applied Optics|February 13, 2008
Transmission and reflection ellipsometry of thin films and multilayer systemsG Bader, P V Ashrit, V V Truong
The Review of Scientific Instruments|May 5, 2007
Design of a physical vapor transport cell for time controlled deposition of nucleation phase organic thin filmsJesse S Mea, Serge Gauvin, P V Ashrit
Optics Letters|May 2, 2013
Mid-IR laser beam quality measurement through vanadium dioxide optical switchingS Bonora, G Beydaghyan, A Haché, et al.
Applied Optics|April 29, 2010
Selective behavior of aggregated Ag and Cu films deposited on Al substratesP V Ashrit, F E Girouard, V V Truong
Applied Optics|June 16, 2010
Water absorption studies in thin films by the IR attenuated total reflection methodP V Ashrit, S Badilescu, F E Girouard, et al.
Applied Optics|November 2, 2010
Reflection-transmission photoellipsometry: theory and experimentsG Bader, P V Ashrit, F E Girouard, et al.
Optics Letters|January 19, 2010
Mid-IR to near-IR image conversion by thermally induced optical switching in vanadium dioxideS Bonora, U Bortolozzo, S Residori, et al.
ACS Applied Materials & Interfaces|November 13, 2013
Fabrication of high-quality VO2 thin films by ion-assisted dual ac magnetron sputteringCheikhou Ba, Souleymane T Bah, Marc D'Auteuil, et al.
Pageof 1

Showing results (1-10 of 8) with videos related to

Sort By:
Pageof 1
Applied Optics|February 13, 2008
Transmission and reflection ellipsometry of thin films and multilayer systemsG Bader, P V Ashrit, V V Truong
The Review of Scientific Instruments|May 5, 2007
Design of a physical vapor transport cell for time controlled deposition of nucleation phase organic thin filmsJesse S Mea, Serge Gauvin, P V Ashrit
Optics Letters|May 2, 2013
Mid-IR laser beam quality measurement through vanadium dioxide optical switchingS Bonora, G Beydaghyan, A Haché, et al.
Applied Optics|April 29, 2010
Selective behavior of aggregated Ag and Cu films deposited on Al substratesP V Ashrit, F E Girouard, V V Truong
Applied Optics|June 16, 2010
Water absorption studies in thin films by the IR attenuated total reflection methodP V Ashrit, S Badilescu, F E Girouard, et al.
Applied Optics|November 2, 2010
Reflection-transmission photoellipsometry: theory and experimentsG Bader, P V Ashrit, F E Girouard, et al.
Optics Letters|January 19, 2010
Mid-IR to near-IR image conversion by thermally induced optical switching in vanadium dioxideS Bonora, U Bortolozzo, S Residori, et al.
ACS Applied Materials & Interfaces|November 13, 2013
Fabrication of high-quality VO2 thin films by ion-assisted dual ac magnetron sputteringCheikhou Ba, Souleymane T Bah, Marc D'Auteuil, et al.
Pageof 1