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Applied Optics|August 12, 2011
Analytical model for low finesse, external cavity, fiber Fabry-Perot interferometers including multiple reflections and angular misalignmentPaul R Wilkinson, Jon R Pratt
Nanotechnology|August 28, 2012
Accurate and precise calibration of AFM cantilever spring constants using laser Doppler vibrometryRichard S Gates, Jon R Pratt
The Review of Scientific Instruments|April 3, 2016
Active cancellation of residual amplitude modulation in a frequency-modulation based Fabry-Perot interferometerYinan Yu, Yicheng Wang, Jon R Pratt
Nanotechnology|June 1, 2013
Experimental determination of mode correction factors for thermal method spring constant calibration of AFM cantilevers using laser Doppler vibrometryRichard S Gates, William A Osborn, Jon R Pratt
The Review of Scientific Instruments|July 2, 2009
Accurate noncontact calibration of colloidal probe sensitivities in atomic force microscopyKoo-Hyun Chung, Gordon A Shaw, Jon R Pratt
Langmuir : the ACS Journal of Surfaces and Colloids|October 16, 2009
Lateral force calibration: accurate procedures for colloidal probe friction measurements in atomic force microscopyKoo-Hyun Chung, Jon R Pratt, Mark G Reitsma
Journal of Research of the National Institute of Standards and Technology|March 19, 2016
Atomic Force Microscope Cantilever Flexural Stiffness Calibration: Toward a Standard Traceable MethodRichard S Gates, Mark G Reitsma, John A Kramar, et al.
The Review of Scientific Instruments|December 3, 2008
SI traceable calibration of an instrumented indentation sensor spring constant using electrostatic forceKoo-Hyun Chung, Stefan Scholz, Gordon A Shaw, et al.
Journal of the Royal Society, Interface|August 7, 2008
Dynamic mechanical oscillations during metamorphosis of the monarch butterflyAndrew E Pelling, Paul R Wilkinson, Richard Stringer, et al.
The Review of Scientific Instruments|March 3, 2010
A low noise all-fiber interferometer for high resolution frequency modulated atomic force microscopy imaging in liquidsHaider I Rasool, Paul R Wilkinson, Adam Z Stieg, et al.
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