Showing results (1-10 of 6) with videos related to
Sort By:
Pageof 1
Physical Review Letters|July 12, 2024
Spatially Resolved Dielectric Loss at the Si/SiO_{2} InterfaceMegan Cowie, Taylor J Z Stock, Procopios C Constantinou, et al.Proceedings of the National Academy of Sciences of the United States of America|October 24, 2024
Spatially resolved random telegraph fluctuations of a single trap at the Si/SiO2 interfaceMegan Cowie, Procopios C Constantinou, Neil J Curson, et al.Advanced Materials (Deerfield Beach, Fla.)|February 21, 2024
Single-Atom Control of Arsenic Incorporation in Silicon for High-Yield Artificial Lattice FabricationTaylor J Z Stock, Oliver Warschkow, Procopios C Constantinou, et al.Science Advances|April 19, 2023
Resistless EUV lithography: Photon-induced oxide patterning on siliconLi-Ting Tseng, Prajith Karadan, Dimitrios Kazazis, et al.ACS Nano|March 7, 2020
Atomic-Scale Patterning of Arsenic in Silicon by Scanning Tunneling MicroscopyTaylor J Z Stock, Oliver Warschkow, Procopios C Constantinou, et al.Physical Review Letters|March 13, 2026
Van Hove Singularities, Superconductivity, and the Josephson Diode Effect in NiTe_{2} and PdTe_{2}Emily C McFarlane, Antonio Sanna, Matthew J Gilbert, et al.Pageof 1