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Rama K Vasudevan

Showing results (1-10 of 55) with videos related to

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ACS Applied Materials & Interfaces|June 25, 2020
Visualizing Charge Transport and Nanoscale Electrochemistry by Hyperspectral Kelvin Probe Force MicroscopyLiam Collins, Rama K Vasudevan, Alp Sehirlioglu
Nano Letters|August 13, 2016
Phases and Interfaces from Real Space Atomically Resolved Data: Physics-Based Deep Data Image AnalysisRama K Vasudevan, Maxim Ziatdinov, Stephen Jesse, et al.
ACS Applied Materials & Interfaces|January 5, 2021
Toward Decoding the Relationship between Domain Structure and Functionality in Ferroelectrics via Hidden Latent VariablesSergei V Kalinin, Kyle Kelley, Rama K Vasudevan, et al.
Nanotechnology|November 12, 2021
Exploring electron beam induced atomic assembly via reinforcement learning in a molecular dynamics environment<sup></sup>Rama K Vasudevan, Ayana Ghosh, Maxim Ziatdinov, et al.
Journal of Chemical Theory and Computation|September 12, 2017
Consistent Integration of Experimental and Ab Initio Data into Effective Physical ModelsLukas Vlcek, Rama K Vasudevan, Stephen Jesse, et al.
Patterns (New York, N.Y.)|November 30, 2023
Explainability and human intervention in autonomous scanning probe microscopyYongtao Liu, Maxim A Ziatdinov, Rama K Vasudevan, et al.
ACS Nano|October 1, 2014
Big-data reflection high energy electron diffraction analysis for understanding epitaxial film growth processesRama K Vasudevan, Alexander Tselev, Arthur P Baddorf, et al.
ACS Nano|September 28, 2017
Knowledge Extraction from Atomically Resolved ImagesLukas Vlcek, Artem Maksov, Minghu Pan, et al.
Nanotechnology|October 23, 2015
The Ehrlich-Schwoebel barrier on an oxide surface: a combined Monte-Carlo and in situ scanning tunneling microscopy approachAnthony G Gianfrancesco, Alexander Tselev, Arthur P Baddorf, et al.
Nano Letters|March 31, 2025
Deep Learning with Reflection High-Energy Electron Diffraction Images to Predict Cation Ratio in Sr<sub>2</sub>Ti<sub>2(1-</sub>O<sub>3</sub> Thin FilmsSumner B Harris, Patrick T Gemperline, Christopher M Rouleau, et al.
Pageof 6

Showing results (1-10 of 55) with videos related to

Sort By:
Pageof 6
ACS Applied Materials & Interfaces|June 25, 2020
Visualizing Charge Transport and Nanoscale Electrochemistry by Hyperspectral Kelvin Probe Force MicroscopyLiam Collins, Rama K Vasudevan, Alp Sehirlioglu
Nano Letters|August 13, 2016
Phases and Interfaces from Real Space Atomically Resolved Data: Physics-Based Deep Data Image AnalysisRama K Vasudevan, Maxim Ziatdinov, Stephen Jesse, et al.
ACS Applied Materials & Interfaces|January 5, 2021
Toward Decoding the Relationship between Domain Structure and Functionality in Ferroelectrics via Hidden Latent VariablesSergei V Kalinin, Kyle Kelley, Rama K Vasudevan, et al.
Nanotechnology|November 12, 2021
Exploring electron beam induced atomic assembly via reinforcement learning in a molecular dynamics environment<sup></sup>Rama K Vasudevan, Ayana Ghosh, Maxim Ziatdinov, et al.
Journal of Chemical Theory and Computation|September 12, 2017
Consistent Integration of Experimental and Ab Initio Data into Effective Physical ModelsLukas Vlcek, Rama K Vasudevan, Stephen Jesse, et al.
Patterns (New York, N.Y.)|November 30, 2023
Explainability and human intervention in autonomous scanning probe microscopyYongtao Liu, Maxim A Ziatdinov, Rama K Vasudevan, et al.
ACS Nano|October 1, 2014
Big-data reflection high energy electron diffraction analysis for understanding epitaxial film growth processesRama K Vasudevan, Alexander Tselev, Arthur P Baddorf, et al.
ACS Nano|September 28, 2017
Knowledge Extraction from Atomically Resolved ImagesLukas Vlcek, Artem Maksov, Minghu Pan, et al.
Nanotechnology|October 23, 2015
The Ehrlich-Schwoebel barrier on an oxide surface: a combined Monte-Carlo and in situ scanning tunneling microscopy approachAnthony G Gianfrancesco, Alexander Tselev, Arthur P Baddorf, et al.
Nano Letters|March 31, 2025
Deep Learning with Reflection High-Energy Electron Diffraction Images to Predict Cation Ratio in Sr<sub>2</sub>Ti<sub>2(1-</sub>O<sub>3</sub> Thin FilmsSumner B Harris, Patrick T Gemperline, Christopher M Rouleau, et al.
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